IP Library › Granted Patent US 8,026,674
Granted Patent B2
US 8,026,674 · App. 12/205,002 · Granted Sep 27, 2011

Electron source and method for the operation thereof

Assignee: Siemens Aktiengesellschaft
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Quick Facts
Patent No.
US 8,026,674
App. No.
12/205,002
Granted
Sep 27, 2011
Kind
B2
Abstract

An electron source has an electron emitter with an electron emission cathode, a high voltage unit provided for power supply of the electron emission cathode, and a low voltage unit provided to control the high voltage unit. Data are transmitted non-electrically (in particular optically) between the high voltage unit and the low voltage unit.

Claims (23)

1. An electron source comprising:

an electron emitter comprising an electron emission cathode;

a high voltage unit connected to the electron emission cathode that supplies power thereto, said high voltage unit comprising a processor therein configured to obtain at least one measurement value pertaining to operation of said election emitter;

a low voltage unit configured to control operation of the high voltage unit; and

an electrically isolated data transmission path between the high voltage unit and the low voltage unit, said low voltage unit supplying data comprising said control instructions to the high voltage unit via the electrically isolated data transmission path; and

said processor in said high voltage unit being configured to receive said control instructions and to adjust said control instructions dependent on said at least one measurement value to produce a processor output, and to supply said processor output to said electron emitter to control said operation of said electron emitter.

2. An electron source as claimed in claim 1 wherein said data transmission path is an optical data transmission path.

3. An electron source as claimed in claim 1 wherein said data transmission path is a bi-directional data transmission path.

4. An electron source as claimed in claim 1 wherein said electron emitter has a control electrode operated by said processor output signal.

5. An electron source as claimed in claim 4 wherein said control electrode is a screen electrode.

6. An electron source as claimed in claim 1 comprising a unipolar high voltage line connecting said high voltage unit to said electron emitter for supplying power to said electron emitter.

7. An electron source as claimed in claim 6 wherein said high voltage line comprises resistance damping.

8. A method for operating an electron source, comprising the steps of:

supplying an electron emitter with voltage from a high voltage unit to cause an electron emission cathode of said electron emitter to emit electrons;

controlling operation of said high voltage unit with a low voltage unit according to control signals;

supplying data representing said control signals from said low voltage unit to said high voltage unit via a non-electrical path between the high voltage unit and the low voltage unit;

with a processor in said high voltage unit, obtaining at least one measurement value pertaining to operation of said electron emitter; and

in said processor, adjusting said control signals dependent on said at least one measurement value to produce a processor output, and supplying said processor output to said electron emitter to control said operation of said electron emitter.

9. A method as claimed in claim 8 comprising measuring a current flowing through the electron emission cathode, and generating a measurement value corresponding to said current and supplying said measurement value from said high voltage unit to said low voltage unit non-electrically.

10. A method as claimed in claim 8 comprising measuring a resistance of said electron emission cathode and generating resistance data corresponding thereto, and supplying said resistance data from said high voltage unit to said low voltage unit non-electrically.

11. A method as claimed in claim 8 comprising measuring a temperature of the electron emission cathode and using the measured temperature in said low voltage unit to generate a control signal for operating said electron emitter.

12. A method as claimed in claim 8 comprising transferring data via said non-electrical path from said low voltage unit to said high voltage unit that relate to a control electrode that interacts with said electron emission cathode.

13. An electron source as claimed in claim 1 wherein said processor is configured to obtain, as said at least one measurement value pertaining to operation of said electron emitter, a measurement of a temperature of said electron emission cathode.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE PREVIOUSLY RECORDED AT REEL: 066088 FRAME: 0256. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 17, 2024
From: SIEMENS HEALTHCARE GMBH
To: SIEMENS HEALTHINEERS AG
Reel/Frame 071178/0246 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2023
From: SIEMENS HEALTHCARE GMBH
To: SIEMENS HEALTHINEERS AG
Reel/Frame 066088/0256 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 28, 2016
From: SIEMENS AKTIENGESELLSCHAFT
To: SIEMENS HEALTHCARE GMBH
Reel/Frame 039271/0561 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2008
From: BERK, JAN; DEURINGER, JOSEF
To: SIEMENS AKTIENGESELLSCHAFT
Reel/Frame 021845/0474 →
Priority Claims (1)
DE 10 2007 042 108 · Sep 5, 2007 · national
Continuity (1)
Related Publication 20090058319A1 · Mar 5, 2009