IP Library Granted Patent US 8,035,696
Granted Patent B2
US 8,035,696 · App. 12/024,195 · Granted Oct 11, 2011

Solid-state imaging apparatus and imaging apparatus

Assignee: Sony Corporation
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,035,696
App. No.
12/024,195
Granted
Oct 11, 2011
Kind
B2
Abstract

A solid-state imaging apparatus includes comparing means for comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner, analog-digital converting means for outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparing means, reset signal generating means for generating a reset signal that triggers a reset operation to be input to the comparing means in order to adjust the reference in the analog-digital converting means, and waveform processing means provided between the reset signal generating means and the comparing means for increasing the degree of dullness of a waveform of the reset signal.

Claims (37)

1. A solid-state imaging apparatus comprising:

comparing means for comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner;

analog-digital converting means for outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparing means;

reset signal generating means for generating a pulse reset signal that triggers a reset operation of the comparing means in order to adjust the reference in the analog-digital converting means; and

waveform processing means provided between the reset signal generating means and a reset signal input of the comparing means for increasing the degree of dullness of a waveform of the reset signal, the increase in dullness meaning an increase in rise and fall times of the pulse reset signal.

2. The solid-state imaging apparatus according to claim 1 , wherein the comparing means is provided at each column of the pixel section.

3. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses the load of a capacitor.

4. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses the load of a resistance.

5. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses a CMOS inverter.

6. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses a CMOS inverter; and

the numbers of P-channel MOS and N-channel MOS included in the CMOS inverter differ.

7. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses a CMOS inverter; and

a switch for operation control is provided in either P-channel MOS or N-channel MOS included in the CMOS inverter.

8. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses a CMOS inverter; and

the CMOS inverter drives a direct current source.

9. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses the load of a wire provided between the reset signal generating means and the comparing means.

10. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means is configured to increase the load of a wire as the distance from the reset signal generating means decreases in a wiring path from the reset signal generating means to the comparing means.

11. The solid-state imaging apparatus according to claim 1 , wherein the comparing means is provided at each column of the pixel section; and

the lengths of the wiring paths from the reset signal generating means to the comparing means at the columns are equal.

12. The solid-state imaging apparatus according to claim 1 , wherein the waveform processing means uses a capacitor within the comparing means.

13. An imaging apparatus comprising:

comparing means for comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner;

analog-digital converting means for outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparing means;

reset signal generating means for generating a pulse reset signal that triggers a reset operation of the comparing means in order to adjust the reference in the analog-digital converting means;

waveform processing means provided between the reset signal generating means and a reset signal input of the comparing means for increasing the degree of dullness of a waveform of the reset signal, the increase in dullness meaning an increase in rise and fall times of the pulse reset signal; and

control means for controlling at least the analog-digital converting means and the reset signal generating means.

14. A solid-state imaging apparatus comprising:

a comparing section comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner;

an analog-digital converting section outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparing section;

a reset signal generating section generating a pulse reset signal that triggers a reset operation of the comparing section in order to adjust the reference in the analog-digital converting section; and

a waveform processing section provided between the reset signal generating section and a reset signal input of the comparing section, the waveform processing section increasing the degree of dullness of a waveform of the reset signal, the increase in dullness meaning an increase in rise and fall times of the pulse reset signal.

15. An imaging apparatus comprising:

a comparing section comparing a pixel signal obtained by a pixel section and a reference signal the value of which varies in a stepwise manner;

an analog-digital converting section outputting, as a digital value, the amount of time when the pixel signal and the reference signal change levels by the comparing section;

a reset signal generating section generating a pulse reset signal that triggers a reset operation of the comparing section in order to adjust the reference in the analog-digital converting section;

a waveform processing section provided between the reset signal generating section and a reset signal input of the comparing section, the waveform processing section increasing the degree of dullness of a waveform of the reset signal, the increase in dullness meaning an increase in rise and fall times of the pulse reset signal; and

a control section controlling at least the analog-digital converting section and the reset signal generating section.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 4, 2008
From: YAMAGATA, YUUKI; KOSEKI, KEN; KIKUCHI, MASARU; INADA, YOSHIAKI; INUTSUKA, JUNICHI; TAJIMA, AKARI
To: SONY CORPORATION
Reel/Frame 020458/0599 →
Priority Claims (1)
JP 2007-025031 · Feb 5, 2007 · national
Continuity (1)
Related Publication 20080186388A1 · Aug 7, 2008