Quantitative differential interference contrast (DIC) microscopy and photography based on wavefront sensors

1. A wavefront microscope comprising:

(a) a light source configured to illuminate a sample;

(b) a wavefront relay system configured to relay a wavefront generated by the sample;

(c) a wavefront sensor configured to:

(i) receive the wavefront from the wavefront relay system;

(ii) measure a local intensity of the wavefront; and

(iii) measure a phase gradient of the wavefront; and

(d) an output mechanism for outputting a local intensity two dimensional (2D) image map and a phase gradient 2D image map.

2. The wavefront microscope of claim 1 , wherein:

(a) the wavefront sensor comprises a single pixel wavefront sensor; and

(b) the local intensity 2D image map and phase gradient 2D image map are obtained via raster scanning.

3. The wavefront microscope of claim 1 , wherein:

(a) the wavefront sensor comprises a wavefront sensor array; and

(b) the local intensity 2D image map and phase gradient 2D image map comprise a snapshot of the entire sample.

4. The wavefront microscope of claim 1 , wherein the wavefront sensor comprises:

(a) a metal film having one or more patterned structured 2D apertures configured to convert the phase gradient of the wavefront into a measurable form; and

(b) a photodetector array configured to:

(i) receive the wavefront projected through the one or more 2D apertures; and

(ii) output a measurement of:

(1) the phase gradient of the wavefront; and

(2) the local intensity of the wavefront.

5. The wavefront microscope of claim 1 , wherein the wavefront sensor comprises:

(a) a microlenses array configured to focus the wavefront across each lens of the microlenses array and form a spot onto a photosensor array; and

(b) the photosensor array configured to output a measurement of:

(i) the phase gradient of the wavefront; and

(ii) the local intensity of the wavefront.

6. The wavefront microscope of claim 1 , wherein differential interference contrast (DIC) functionality of the wavefront microscope is integrated into the wavefront sensor.

7. A wavefront sensor comprising:

(a) a metal film having one or more patterned structured two dimensional (2D) apertures configured to convert a phase gradient of a wavefront into a measurable form; and

(b) a photodetector array configured to:

(i) receive the wavefront projected through the one or more 2D apertures; and

(ii) output a measurement of:

(1) the phase gradient of the wavefront; and

(2) an intensity of the wavefront.

8. The wavefront sensor of claim 7 , wherein multiple apertures are arranged into a two-dimensional wavefront sensor array.

9. The wavefront sensor of claim 7 , wherein the patterned structured 2D apertures comprise a Fresnel zone plate.

10. A method for measuring a wavefront in a wavefront microscope comprising:

(a) illuminating a sample;

(b) relaying the wavefront generated by the sample;

(c) receiving the relayed wavefront at a wavefront sensor;

(d) measuring, using the wavefront sensor, a local intensity of the wavefront;

(e) measuring, using the wavefront sensor, a phase gradient of the wavefront; and

(f) outputting a local intensity two dimensional (2D) image map and a phase gradient 2D image map based on the local intensity and phase gradient.

11. The method of claim 10 , wherein

(a) the wavefront sensor comprises a single pixel wavefront sensor; and

(b) the local intensity 2D image map and phase gradient 2D image map are obtained via raster scanning.

12. The method of claim 10 , wherein

(a) the wavefront sensor comprises a wavefront sensor array; and

(b) the local intensity 2D image map and phase gradient 2D image map comprise a snapshot of the entire sample.

13. The method of claim 10 , wherein the wavefront sensor comprises:

(a) a metal film having one or more patterned structured 2D apertures configured to convert the phase gradient of the wavefront into a measurable form; and

(b) a photodetector array configured to:

(i) receive the wavefront projected through the one or more 2D apertures; and

(ii) output a measurement of:

(1) the phase gradient of the wavefront; and

(2) the local intensity of the wavefront.

14. The method of claim 10 , wherein the wavefront sensor comprises:

(a) a microlenses array configured to focus the wavefront across each lens of the microlenses array and form a spot onto a photosensor array;

(b) the photosensor array configured to output a measurement of:

(i) the phase gradient of the wavefront; and

(ii) the local intensity of the wavefront.

15. The method of claim 10 , wherein differential interference contrast (DIC) functionality of the wavefront microscope is integrated into the wavefront sensor.

16. A method for detecting a wavefront comprising:

(a) projecting the wavefront through a metal film having one or more patterned structured two dimensional (2D) apertures onto a photodetector array;

(b) receiving, in the photodetector array, the wavefront projected through the one or more 2D apertures; and

(c) outputting a measurement of:

(1) a phase gradient of the wavefront; and

(2) an intensity of the wavefront.

17. The method of claim 16 , further comprising arranging multiple apertures into a 2D wavefront sensor array.

18. A method for measuring a wavefront in a wavefront camera system comprising:

(a) illuminating an object;

(b) relaying the wavefront generated by the object;

(c) receiving the relayed wavefront at a wavefront sensor;

(d) measuring, using the wavefront sensor, a local intensity of the wavefront;

(e) measuring, using the wavefront sensor, a phase gradient of the wavefront; and

(f) outputting a local intensity two dimensional (2D) image map and a phase gradient 2D image map based on the local intensity and phase gradient.