Micromechanical devices for materials characterization
The present disclosure describes micromechanical devices and methods for using such devices for characterizing a material's strength. The micromechanical devices include an anchor pad, a top shuttle platform, a nanoindenter in movable contact with the top shuttle platform and at least two sample stage shuttles. The nanoindenter applies a compression force to the top shuttle platform, and the at least two sample stage shuttles move apart in response to the compression force. Each of the at least two sample stage shuttles is connected to the top shuttle platform and to the anchor pad by at least one inclined beam. Methods for using the devices include connecting a sample between the at least two sample stage shuttles and applying a compression force to the top shuttle platform. Application of the compression force to the top shuttle platform results in a tensile force being applied to the sample. Measuring a tip displacement of the nanoindenter is correlated with the sample's strength. Illustrative materials that can be studied using the micromechanical devices include, for example, nanotubes, nanowires, nanorings, nanocomposites and protein fibrils.
1. A micromechanical device for characterizing a material's strength, said device comprising:
an anchor pad;
a top shuttle platform;
a nanoindenter in movable contact with the top shuttle platform;
wherein the nanoindenter applies a compression force to the top shuttle platform; and
at least two sample stage shuttles;
wherein each of the at least two sample stage shuttles is connected to the top shuttle platform by at least one inclined beam;
wherein each of the at least two sample stage shuttles is connected to the anchor pad by at least one inclined beam; and
wherein the at least two sample stage shuttles move apart from one another in response to the compression force.
2. The device of claim 1 , further comprising:
a viewing means for observing a material in the device while the compression force is being applied.
3. The device of claim 2 , wherein the viewing means is a transmission electron microscope.
4. The device of claim 2 , wherein the viewing means is a scanning electron microscope.
5. The device of claim 2 , wherein the viewing means is an optical microscope.
6. The device of claim 2 , further comprising:
a viewing window that is substantially transparent to the viewing means.
7. The device of claim 1 , wherein there are equal numbers of inclined beams on each sample stage shuttle.
8. The device of claim 7 , wherein there are two planes of symmetry bisecting the device.
9. The device of claim 1 , wherein there are equal numbers of inclined beams connecting each sample stage shuttle to the top shuttle platform and to the anchor pad.
10. The device of claim 1 , wherein there is an asymmetrical placement of the inclined beams on the sample stage shuttles.
11. The device of claim 1 , wherein there are unequal numbers of inclined beams connecting each sample stage shuttle to the top shuttle platform and to the anchor pad.
12. The device of claim 11 , wherein there are two planes of symmetry bisecting the device.
13. The device of claim 1 , wherein each inclined beam contacts the at least two sample stage shuttles at the same angle.
14. The device of claim 1 , wherein at least one of the inclined beams contacts the at least two sample stage shuttles at an angle that is different than that of any other of the inclined beams.
15. The device of claim 1 , wherein a stiffness of the device is adjustable by modifying at least one device parameter selected from the group consisting of a thickness of the device, a number of inclined beams, and an angle at which the inclined beams contact the at least two sample stage shuttles.
16. The device of claim 1 , wherein the nanoindenter is a quantitative nanoindenter.
17. The device of claim 1 , wherein the nanoindenter comprises a blunt cube corner nanoindenter tip.
18. The device of claim 1 , wherein the device comprises silicon.
19. A method for measuring a sample's strength, said method comprising:
providing the device of claim 1 ;
connecting a sample between the at least two sample stage shuttles;
applying a compression force to the top shuttle platform with the nanoindenter; and
measuring a tip displacement of the nanoindenter.
20. The method of claim 19 , wherein the tip displacement correlates with the sample's strength.
21. The method of claim 19 , further comprising:
placing the device on a stage of a microscope.
22. The method of claim 21 , further comprising:
observing the sample with the microscope while the compression force is being applied.
23. The method of claim 22 , wherein the microscope is selected from the group consisting of a scanning electron microscope and a transmission electron microscope.
24. The method of claim 23 , wherein the observing step is conducted with an electron beam.
25. The method of claim 22 , wherein the microscope is an optical microscope.
26. The method of claim 25 , wherein the device is immersed in a liquid.
27. The method of claim 19 , wherein the connecting step comprises attaching the sample to the at least two sample stage shuttles with epoxy.