IP Library › Granted Patent US 8,067,316
Granted Patent B2
US 8,067,316 · App. 12/485,652 · Granted Nov 29, 2011

Method for manufacturing memory element

Assignee: Semiconductor Energy Laboratory Co., Ltd.
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Quick Facts
Patent No.
US 8,067,316
App. No.
12/485,652
Granted
Nov 29, 2011
Kind
B2
Abstract

A conductive paste including conductive particles each of which has a size of greater than or equal to 0.1 μm and less than or equal to 10 μm, a resin, and a solvent is placed over a first conductor and the solvent is vaporized. In this manner, a second conductor having the conductive particles and a memory layer including the resin between the first conductor and the conductive particles is formed.

Claims (31)

1. A method for manufacturing a memory element, comprising the steps of:

forming a first conductor;

forming a semiconductor layer over the first conductor;

placing a conductive paste over the semiconductor layer, the conductive paste comprising conductive particles, a resin, and a solvent; and

vaporizing the solvent to form a second conductor, the second conductor comprising the conductive particles and a memory layer including the resin between the first conductor and the conductive particles.

2. The method for manufacturing a memory element according to claim 1 ,

wherein the conductive paste is placed by a droplet discharge method or a printing method.

3. The method for manufacturing a memory element according to claim 1 ,

wherein the solvent is vaporized at a temperature higher than or equal to 10° C. and less than or equal to 280° C.

4. The method for manufacturing a memory element according to claim 1 ,

wherein the conductive particles are silver particles.

5. The method for manufacturing a memory element according to claim 1 ,

wherein the resin is a phenol resin, an epoxy resin, a polyester resin, a silicone resin, an urea resin, an acrylic resin or a cellulose resin.

6. The method for manufacturing a memory element according to claim 1 , wherein the semiconductor layer is an inorganic semiconductor layer.

7. The method for manufacturing a memory element according to claim 1 , wherein each of the conductive particles has a size of greater than or equal to 0.1 μm and less than or equal to 10 μm.

8. The method for manufacturing a memory element according to claim 1 , wherein a proportion of the conductive particles in the conductive paste is from 80 wt % to 95 wt %.

9. A method for manufacturing a memory element, comprising the steps of:

forming a first conductor;

forming a semiconductor layer over the first conductor;

placing a conductive paste so as to be in contact with a portion of the semiconductor layer, the conductive paste comprising conductive particles, a resin, and a solvent; and

vaporizing the solvent to form a second conductor so as to overlap with the portion of the first conductor, the second conductor comprising the conductive particles and a memory layer including the resin between the first conductor and the conductive particles.

10. The method for manufacturing a memory element according to claim 9 ,

wherein the conductive paste is placed by a droplet discharge method or a printing method.

11. The method for manufacturing a memory element according to claim 9 ,

wherein the solvent is vaporized at a temperature higher than or equal to 10° C. and less than or equal to 280° C.

12. The method for manufacturing a memory element according to claim 9 ,

wherein the conductive particles are silver particles.

13. The method for manufacturing a memory element according to claim 9 ,

wherein the resin is a phenol resin, an epoxy resin, a polyester resin, a silicone resin, an urea resin, an acrylic resin or a cellulose resin.

14. The method for manufacturing a memory element according to claim 9 , wherein each of the conductive particles has a size of greater than or equal to 0.1 μm and less than or equal to 10 μm.

15. The method for manufacturing a memory element according to claim 9 , wherein a proportion of the conductive particles in the conductive paste is from 80 wt % to 95 wt %.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 16, 2009
From: NAGATA, TAKAAKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 022832/0959 →
Priority Claims (1)
JP 2008-161257 · Jun 20, 2008 · national
Continuity (1)
Related Publication 20090317968A1 · Dec 24, 2009