IP Library › Granted Patent US 8,107,074
Granted Patent B2
US 8,107,074 · App. 12/665,576 · Granted Jan 31, 2012

Analytical method for optical measurement

Assignee: Shimadzu Corporation
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Quick Facts
Patent No.
US 8,107,074
App. No.
12/665,576
Granted
Jan 31, 2012
Kind
B2
Abstract

An electric field spatially-regularly arranged is applied to particles movably dispersed in a medium to migrate particles. The resulting density distribution of the particles generates a diffraction grating. In the annihilation process of the diffraction grating through the stop or modulation of the application of the electric field, intensity of diffracted light from the diffraction grating is measured to obtain the size of particles. In the above measurement method, the square root or natural logarithm of the measured value of the diffracted light intensity is used for the analysis to evaluate with high convergence the dispersiveness of the particle size with using the least squares method even in the case of particles of dispersive diameter or the case where particles to be measured include particles of different sizes.

Claims (24)

1. An analytical method for an optical measurement method, comprising:

using an apparatus which includes:

a container for storing a liquid or gel sample in which particles are dispersed movably in a medium;

a power source for generating a voltage with a given pattern including DC, frequency modulation, and voltage modulation, or a pattern arbitrarily set;

an electrode pair disposed in the container, and adapted to be applied with the voltage from the power source to generate a electric field distribution arranged regularly in the container;

control means for controlling the application of the voltage from the power source to the electrode pair to control the generation and annihilation of a diffraction grating resulting from the density distribution of particles generated from a migrating force acting on the particles in the sample in the container;

a light source for applying light to a portion of the container where the diffraction grating is generated; and

a light detector for detecting diffracted light of the light generated by the diffraction grating; and

analyzing the size of the particles in the sample from the temporal change of diffracted light intensity detected by the light detector, wherein

in the particle size analysis, the size distribution of the particles is obtained based on the temporal data of the square root of the diffracted light intensity sequentially detected.

2. An analytical method for an optical measurement method, comprising:

using an apparatus which includes:

a container for storing a liquid or gel sample in which particles are dispersed movably in a medium;

a power source for generating a voltage with a given pattern including DC, frequency modulation, and voltage modulation, or a pattern arbitrarily set;

an electrode pair disposed in the container, and adapted to be applied with the voltage from the power source to generate a electric field distribution arranged regularly in the container;

control means for controlling the application of the voltage from the power source to the electrode pair to control the generation and annihilation of a diffraction grating resulting from the density distribution of particles generated from a migrating force acting on the particles in the sample in the container;

a light source for applying light to a portion of the container where the diffraction grating is generated; and

a light detector for detecting diffracted light of the light generated by the diffraction grating; and

analyzing the size of the particles in the sample from the temporal change of diffracted light intensity detected by the light detector, wherein

in the particle size analysis, the size distribution of the particles is obtained based on the temporal data of the natural logarithm of the diffracted light intensity sequentially detected.

3. The analytical method for the optical measurement method according to claim 1 , wherein

dispersion of the particles is analyzed with utilizing the cumulant expansion theorem.

4. The analytical method for the optical measurement method according to claim 2 , wherein

dispersion of the particles is analyzed with utilizing the cumulant expansion theorem.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2010
From: MORIYA, NAOJI
To: SHIMADZU CORPORATION
Reel/Frame 023809/0963 →
Continuity (1)
Related Publication 20100201982A1 · Aug 12, 2010