IP Library Granted Patent US 8,117,897
Granted Patent B2
US 8,117,897 · App. 11/944,892 · Granted Feb 21, 2012

Elliptical photo-acoustic sensor

Assignee: Applied Nanotech Holdings, Inc.
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Quick Facts
Patent No.
US 8,117,897
App. No.
11/944,892
Granted
Feb 21, 2012
Kind
B2
Abstract

An elliptical photo-acoustic spectrometer chamber design will result in a larger intensity signal at the pick-up microphone and allow high frequency light modulation. This makes the spectrometer have a lower limit of detection threshold, and will increase the signal to noise ratio in general for the instrument, resulting in a more sensitive instrument allowing more precise measurements.

Claims (24)

1. A photo-acoustic sensor comprising:

an elliptically shaped chamber having its two foci positioned along its longitudinal axis;

a light excitation path oriented along a first focus of the chamber; and

an acoustic sensor oriented along a second focus of the chamber.

2. The sensor as recited in claim 1 , further comprising a trace gas inside of the chamber to be sensed.

3. The sensor as recited in claim 2 , further comprising a laser for transmitting a laser pulse along the light excitation path.

4. The sensor as recited in claim 3 , wherein a frequency of the laser pulse is modulated to resonate with the gas.

5. The sensor as recited in claim 1 , wherein the acoustic sensor comprises a flexible tube oriented along the second focus with its ends connected to microphones.

6. The sensor as recited in claim 1 , wherein the acoustic sensor comprises a rigid mechanical pick-up substantially oriented along the second focus and coupled to microphones.

7. The sensor as recited in claim 1 , wherein the acoustic sensor comprises a probing laser signal aimed along the second focus, wherein a frequency of the probing laser signal is resonant with a background gas containing a trace gas to be sensed, the probing laser signal aimed to strike a photodiode positioned on an end wall of the chamber.

8. The sensor as recited in claim 1 , wherein the elliptically shaped chamber comprises a cylinder having a cross-section that is in a shape of an ellipse, wherein the two foci are positioned along the longitudinal axis of the cylinder.

9. The sensor as recited in claim 1 , wherein the elliptically shaped chamber comprises an elliptical cylinder.

10. The sensor as recited in claim 2 , wherein the trace gas is present along the first focus of the chamber.

11. The sensor as recited in claim 1 , wherein for a cross-section of the chamber perpendicular to the longitudinal axis of the chamber, a path length measured from the first focus to any position along a wall of the chamber to the second focus is constant.

12. A photo-acoustic sensor comprising:

an axially extended elliptical chamber having first and second axially extended foci;

a light excitation path oriented along a length of the first axially extended focus of the chamber; and

an extended acoustic sensor positioned along a length of the second axially extended focus of the chamber.

13. The sensor as recited in claim 12 , further comprising a trace gas present along the first axially extended focus of the chamber.

14. The sensor as recited in claim 13 , further comprising a laser for transmitting a laser pulse along the light excitation path.

15. The sensor as recited in claim 12 , wherein the acoustic sensor comprises a flexible tube oriented along the second axially extended focus with its ends connected to microphones.

16. The sensor as recited in claim 12 , wherein the acoustic sensor comprises a rigid mechanical pick-up substantially oriented along the second axially extended focus and coupled to microphones.

17. The sensor as recited in claim 12 , wherein the acoustic sensor comprises a probing laser signal aimed along the second axially extended focus, wherein a frequency of the probing laser signal is resonant with a background gas containing a trace gas to be sensed, the probing laser signal aimed to strike a photodiode positioned on an end wall of the chamber.

18. The sensor as recited in claim 12 , wherein for a cross-section of the chamber perpendicular to the longitudinal axis of the chamber, a path length measured from the first focus to any position along a wall of the chamber to the second focus is constant.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 29, 2007
From: SCHROPP, DONALD R.; PAVLOVSKY, IGOR; FINK, RICHARD LEE
To: NANO-PROPRIETARY, INC.
Reel/Frame 020177/0161 →
Continuity (2)
Provisional Application 60867361 · Nov 27, 2006
Related Publication 20080121018A1 · May 29, 2008