Transistor and process of producing the same, light-emitting device, and display
A transistor capable of modulating, at low voltages, a large current flowing between an emitter electrode and a collector electrode. A process of producing the transistor, a light-emitting device comprising the transistor, and a display comprising the transistor. The transistor comprises an emitter electrode and a collector electrode. Between the emitter electrode and the collector electrode are situated a semiconductor layer and a sheet base electrode. It is preferred that the semiconductor layer be situated between the emitter electrode and the base electrode and also between the collector electrode and the base electrode to constitute a second semiconductor layer and a first semiconductor layer, respectively. It is also preferred that the thickness of the base electrode be 80 nm or less. Furthermore, a dark current suppressor layer is situated at least between the emitter electrode and the base electrode, or between the collector electrode and the base electrode.
1. A transistor comprising:
an emitter electrode,
a collector electrode, and
a semiconductor layer and a sheet base electrode between the emitter electrode and the collector electrode,
wherein the base electrode has a high surface roughness on its surface.
2. The transistor according to claim 1 , wherein the semiconductor layer is composed of a first semiconductor layer situated between the collector electrode and the base electrode, and a second semiconductor layer situated between the emitter electrode and the base electrode.
3. The transistor according to claim 1 , wherein the base electrode has a thickness of 80 nm or less.
4. The transistor according to claim 2 , wherein the semiconductor layer situated between the collector electrode and the base electrode is a crystalline semiconductor layer.
5. The transistor according to claim 4 , wherein the crystals making up the semiconductor layer have diameters that are nearly equal to or greater than the thickness of the base electrode and that are great enough to cause the high surface roughness on the surface of the base electrode.
6. The transistor according to claim 1 , wherein the base electrode is a film of a metal and its one or each surface is covered with a film of an oxide of the metal.
7. The transistor according to claim 2 , wherein the first semiconductor layer situated between the collector electrode and the base electrode and the second semiconductor layer situated between the emitter electrode and the base electrode are layers of different semiconductor materials.
8. The transistor according to claim 7 , wherein the first semiconductor layer and the second semiconductor layer are hole or electron transporting material layers.
9. A transistor comprising:
an emitter electrode,
a collector electrode, and
a semiconductor layer and a sheet base electrode between the emitter electrode and the collector electrode,
wherein the semiconductor layer is composed of a first semiconductor layer situated between the collector electrode and the base electrode, and a second semiconductor layer situated between the emitter electrode and the base electrode, and
wherein the first semiconductor layer situated between the collector electrode and the base electrode and the second semiconductor layer situated between the emitter electrode and the base electrode are organic compound layers.
10. The transistor according to claim 1 , wherein the thickness T 1 of the first semiconductor layer situated between the collector electrode and the base electrode and the thickness T 2 of the second semiconductor layer situated between the emitter electrode and the base electrode are in a ratio (T 1 /T 2 ) ranging from 1/1 to 10/1.
11. The transistor according to claim 1 , further comprising a charge injection layer between the emitter electrode and the semiconductor layer adjacent to the emitter electrode.
12. The transistor according to claim 11 , wherein the charge injection layer includes an alkaline metal, such as LiF or Ca, or a compound thereof.