Amorphous oxide semiconductor and thin film transistor using the same
There is provided an amorphous oxide semiconductor including hydrogen and at least one element of indium (In) and zinc (Zn), the amorphous oxide semiconductor containing one of hydrogen atoms and deuterium atoms of 1×10 20 cm −3 or more to 1×10 22 cm −3 or less, and a density of bonds between oxygen and hydrogen except bonds between excess oxygen (O EX ) and hydrogen in the amorphous oxide semiconductor being 1×10 18 cm −3 or less.
1. An amorphous oxide semiconductor containing hydrogen and at least one element of indium (In) and zinc (Zn), wherein:
the amorphous oxide semiconductor contains one of hydrogen atoms and deuterium atoms, whose content is more than 1×10 20 cm −3 to 1×10 22 cm − or less; and
a density of bonds between oxygen and hydrogen except bonds between excess oxygen (O Ex ) and hydrogen in the amorphous oxide semiconductor is 1×10 18 cm −3 or less.
2. A thin film transistor comprising a channel layer, a gate insulating layer, a source electrode, a drain electrode, and a gate electrode,
wherein the channel layer comprises the amorphous oxide semiconductor according to claim 1 .
3. The thin film transistor according to claim 2 , wherein an electrical resistivity of the amorphous oxide semiconductor is more than 10Ω and less than 1×10 6 Ω.
4. The thin film transistor according to claim 2 , wherein the amorphous oxide semiconductor further comprises at least one of gallium (Ga) and tin (Sn).
5. A display apparatus comprising a display device and a thin film transistor,
the display device including an electrode connected to one of a source electrode and a drain electrode of the thin film transistor on a substrate,
wherein the thin film transistor comprises a thin film transistor according to claim 2 .
6. The display apparatus according to claim 5 , wherein the display device comprises an electroluminescent device.
7. The display apparatus according to claim 5 , wherein the display device comprises a liquid crystal cell.
8. The display apparatus according to claim 5 , wherein a plurality of the display devices and a plurality of the thin film transistors are disposed two-dimensionally on the substrate.
9. The thin film transistor according to claim 2 , wherein the amorphous oxide semiconductor includes excess oxygen and hydrogen, and a ratio of number of the excess oxygen atoms to number of the hydrogen atoms is 1:2 or more.