Ionic liquids of heterocyclic amines
Ionic liquids having melting points below about 100 C formed by reaction of a heterocyclic amine with about 2.8 and about 3.2 moles of anhydrous hydrogen fluoride per mole of amine nitrogen. Electrochemical devices having non-aqueous electrolytes containing the ionic liquids are also disclosed, as well as silicon oxide etching compositions containing the ionic liquids and etching methods in which silicon oxides are selectively removed by the etching compositions in the presence of aluminum.
1. An ionic liquid comprising a salt of at least one heterocyclic amine and between about 2.8 and about 3.2 moles of anhydrous hydrogen fluoride per mole of amine nitrogen, the ionic liquid having a melting point less than about 100 C and having a specific conductivity greater than about 20 milli-siemens/cm, wherein said heterocyclic amine is selected from the group consisting of substituted and unsubstituted pyrroles, substituted and unsubstituted pyrazoles, substituted and unsubstituted pyridines, substituted and unsubstituted pyrazines, substituted and unsubstituted pyrimidines, substituted and unsubstituted pyridazines, substituted and unsubstituted thiazoles, substituted and unsubstituted oxazoles, substituted and unsubstituted triazoles, substituted and unsubstituted pyrrolidines, substituted and unsubstituted pyrrolidones, substituted and unsubstituted piperazines, substituted and unsubstituted piperidines and substituted and unsubstituted pyrrolines.
2. The ionic liquid of claim 1 , having a melting point less than about 60 C.
3. The ionic liquid of claim 2 , having a melting point less than about 25 C.
4. The ionic liquid according to claim 1 , consisting of one heterocyclic amine ionic compound.
5. The ionic liquid according to claim 1 , consisting of two or more heterocyclic amine ionic compounds.
6. The ionic liquid of claim 1 , wherein said heterocyclic amine is a pyridine or a picoline.
7. An ionic liquid comprising a salt of at least one heterocyclic amine and between about 2.8 and about 3.2 moles of anhydrous hydrogen fluoride per mole of amine nitrogen, the ionic liquid having a melting point less than, about 10° C. and having a specific conductivity greater than about 20 milli-siemens/cm, wherein said heterocyclic amine, is a multi-cyclic fused ring structure containing from 8 to 14 ring members, with from 1 to 3 ring members being a heteroatom selected from the group consisting of nitrogen, oxygen and sulfur, wherein at least one of said heteroatoms is nitrogen.
8. The ionic liquid of claim 7 , wherein said heterocyclic amine is selected from the group consisting of substituted and unsubstituted quinolines, substituted and unsubstituted quinoxalines, substituted and unsubstituted purines and substituted and unsubstituted isoquinolines.
9. An anhydrous etching solution for removing silicon oxides comprising an effective amount of an ionic liquid dissolved in at least one anhydrous solvent, the ionic liquid comprising a salt of at least one heterocyclic amine and between about 2.8 and about 3.2 moles of anhydrous hydrogen fluoride per mole of amine nitrogen, the ionic liquid having a melting point less than about 100 C;
wherein said heterocyclic amine is selected from the group consisting of substituted and unsubstituted pyrroles, substituted and unsubstituted pyrazoles, substituted and unsubstituted pyridines, substituted and unsubstituted pyrazines, substituted and unsubstituted, substituted and unsubstituted pyridazines, substituted and unsubstituted thiazoles, substituted and unsubstituted oxazoles, substituted and unsubstituted triazoles, substituted and unsubstituted pyrrolidines, substituted and unsubstituted pyrrolidones, substituted and unsubstituted piperazines, substituted and unsubstituted piperidines and substituted and unsubstituted pyrrolines.
10. The anhydrous etching solution of claim 9 , wherein said ionic liquid is present in an amount effective to remove a silicon oxide layer at a rate up to about 1250 Angstroms per minute.
11. The anhydrous etching solution of claim 9 , comprising pyridine 3HF in propylene carbonate.
12. A method for removing a silicon oxide layer from a semiconductor substrate comprising contacting the anhydrous etching solution of claim 9 with a silicon oxide layer on the surface of a semiconductor substrate until at least a portion of the silicon oxide layer is removed.
13. The method of claim 12 , wherein said semiconductor substrate comprises an aluminum component having a sacrificial silicon oxide coating layer.