Systems for assessing and enhancing the performance of scanning probe microscopes by quantifying and enforcing symmetries and periodicities in two dimensions
View Patent ↗Scanning probe microscope (SPM) images are enhanced by enforcing one or more symmetries that can be selected based on suitable Fourier coefficient amplitude or phase angle residuals, and/or geometric Akaike information criteria, and/or cross correlation techniques. Alternatively, this selection can be based on prior knowledge of specimen characteristics. In addition, a scanning microscope point spread function is obtained based on the evaluation of a calibration image by enforcing at least one symmetry and can be applied to other image acquisitions.
1. A method, comprising:
obtaining a scanning probe microscope image associated with a sample exhibiting at least 1D periodicity and symmetry; and
processing the scanning probe microscope image crystallographically so as to enforce a symmetry group.
2. The method of claim 1 , further comprising selecting a symmetry group to be enforced based on at least one Fourier coefficient amplitude or phase angle residual.
3. The method of claim 1 , further comprising selecting a symmetry group to be enforced based on the application of at least one geometric Akaike information criterion.
4. The method of claim 1 , further comprising selecting a symmetry group to be enforced based on the application of a cross-correlation technique.
5. The method of claim 1 , further comprising selecting a symmetry group to be enforced based on a combination of at least one suitable Fourier coefficient amplitude or phase angle residual with the application of a cross-correlation technique and/or at least one geometric Akaike information criterion.
6. The method of claim 1 , further comprising displaying the processed image.
7. The method of claim 1 , further comprising determining a microscope imaging characteristic based on the processed scanning probe microscope image.
8. The method of claim 7 , wherein the microscope imaging characteristic is associated with a microscope point spread function.
9. The method of claim 8 , further comprising;
receiving a second scanning probe microscope image; and
processing the second scanning probe microscope image based on the microscope imaging characteristic so as to produce a processed second scanning probe microscope image.
10. The method of claim 7 , further comprising;
receiving a second scanning probe microscope image; and
processing the second scanning probe microscope image based on a microscope point spread function to produce a processed second scanning probe microscope image.
11. The method of claim 1 , wherein the sample exhibiting at least 1D periodicity and symmetry is one of an array of hexaazartriphenylene-hexacarbonitrile (HATCN) molecules on (111) silver, an array of fluorinated cobalt phthalocyanine (F 16 CoPc) molecules on (0001) graphite, or an array of cobalt(II) phthalocyanine molecules on gold.
12. The method of claim 1 , wherein the sample exhibiting at least 1D periodicity and symmetry is one of an array of densely packed monodisperse polystyrene latex spheres on a substrate.
13. The method of claim 1 , further comprising estimating a scanning probe microscope point spread function for a series of progressively larger sample areas, and selecting a particular sample area corresponding to a preferred estimate of the scanning probe microscope point spread function.
14. At least one computer-readable medium comprising computer-executable instructions for performing a method, comprising:
obtaining a scanning probe microscope image associated with a sample exhibiting at least 1D periodicity and symmetry; and
processing the scanning probe microscope image crystallographically so as to enforce symmetry group.
15. At least one computer-readable medium comprising computer-executable instructions for performing a method, comprising:
obtaining a scanning probe microscope image associated with a sample exhibiting at least 1D periodicity and symmetry;
processing the scanning probe microscope image crystallographically so as to enforce a symmetry group; and
determining a microscopic imaging characteristic associated with a microscope point spread function based on the processed scanning probe microscope image based on a series of sample areas.