Apparatus for measuring thickness
A thickness measurement apparatus includes a beam splitter for reflecting or transmitting a ray irradiated from an optical source or a ray reflected by a measurement object; a first lens part which condenses a ray to the measurement object and generates a reference ray; a second lens part for condensing a ray to the object to be measured; an interference light detector for detecting an interference signal generated by the reflected ray and reference ray; a spectroscopic detector corresponding to the second lens part to form a light path different from the path formed by the interference light detector and splits the ray reflected by the measurement object to detect an intensity and wavelength of each split ray; and a light path converter for selectively transmitting a ray to the interference light detector or spectroscopic detector, wherein position exchanging is performed between the first second lens parts.
1. An apparatus for measuring a thickness, comprising: a first beam splitter for reflecting or transmitting a ray irradiated from an optical source or a ray reflected by a measurement object to the measured; a first lens part which condenses a ray to the measurement object and generates a reference ray having a difference of a light path in comparison with a ray reflected by the measurement object; a second lens part for condensing a ray to the measurement object; an interference light detector which corresponds to the first lens part so as to form a light path and detects an interference signal generated by the ray reflected by the measurement object and the reference ray; a spectroscopic detector which corresponds to the second lens part so as to form a light path different from the light path formed by the interference light detector and splits the ray reflected by the measurement object so as to detect an intensity and a wavelength of each split ray; and a light path converter for selectively transmitting a ray to one of the interference light detector and the spectroscopic detector, wherein the light path converter includes a reflecting mirror, which reflects a ray to one of the interference light detector and the spectroscopic detector, and a mirror driving part which moves the reflecting mirror so as to allow the reflecting mirror to be positioned at a light path or to be deviated from the light path, wherein position exchanging is performed between the first lens part and the second lens part.
2. The apparatus as claimed in claim 1 , further comprising a lens driving part allowing one of the first lens part and the second lens part to be selectively positioned at the light path and a controller controlling the mirror driving part and the lens driving part sequentially.
3. The apparatus as claimed in claim 1 , further comprising a lens driving part allowing one of the first lens part and the second lens part to be selectively positioned at a light path.
4. The apparatus as claimed in claim 1 , further comprising at least one of a pinhole and a condenser lens, which is disposed at a light path between the light path converter and the spectroscopic detector.
5. The apparatus as claimed in claim 1 , wherein the first lens part includes a first condenser lens for condensing a ray to the measurement object, a second beam splitter for reflecting or transmitting an incident ray from the first condenser lens, and a reference mirror for reflecting a ray entering from the second beam splitter to the second beam splitter again.