Pin base sensor for high-throughput macromolecular crystallography
Sensing methods and a compact, sample holding pin base sensor are provided for detecting if a sample pin is, for example, properly mounted on a goniometer used for automated, high throughput macromolecular crystallography. A first magnet is used for holding a magnetic base; a second magnet is disposed spaced apart from the first magnet. The first magnet and the second magnet have opposite orientation. A Hall-effect switch is located generally centrally between the first magnet and the second magnet. A state of the Hall-effect switch indicates if a sample pin is properly mounted on a mounting member, such as a goniometer.
1. A sample holding pin base sensor for detecting a mounted sample pin comprising:
a sample pin;
a magnetic base supporting said sample pin;
a mounting member for supporting said magnetic base;
a first magnet for holding the magnetic base;
a second magnet disposed spaced apart from said first magnet, said first magnet and said second magnet having an opposite orientation; and
a Hall-effect switch provided between said first magnet and said second magnet; said Hall-effect switch having a state indicating the sample pin being mounted on said mounting member.
2. The sample holding pin base sensor as recited in claim 1 includes an alignment member for centering a goniometer rotation axis for automated crystallography.
3. The sample holding pin base sensor as recited in claim 1 wherein said Hall-effect switch is generally centrally located between said first magnet and said second magnet.
4. The sample holding pin base sensor as recited in claim 1 wherein said mounting member includes a goniometer.
5. The sample holding pin base sensor as recited in claim 1 wherein said Hall-effect switch has an open state indicating the sample pin is not mounted on said mounting member.
6. The sample holding pin base sensor as recited in claim 1 wherein said Hall-effect switch has a closed state indicating the sample pin is mounted on said mounting member.
7. The sample holding pin base sensor as recited in claim 1 includes a supporting member engaging a mounting face of the magnetic base.
8. The sample holding pin base sensor as recited in claim 7 wherein said supporting member receives said Hall-effect switch, said first magnet, and said second magnet.
9. The sample holding pin base sensor as recited in claim 1 wherein said supporting member is mounted to a goniometer.
10. The sample holding pin base sensor as recited in claim 1 wherein said magnetic base supports an alignment member for aligning with an X-ray beam at a sample position.
11. A method for detecting a mounted sample pin with a sample holding pin base sensor, said method comprising the steps of:
providing a magnetic base supporting a sample pin;
providing a mounting member for supporting said magnetic base;
providing a first magnet for holding the magnetic base and a second magnet disposed spaced apart from said first magnet, said first magnet and said second magnet having an opposite orientation;
providing a Hall-effect switch between said first magnet and said second magnet; and
detecting a state of said Hall-effect switch, said state indicating whether the sample pin being mounted on said mounting member.
12. The method as recited in claim 11 includes providing an alignment member for centering a goniometer rotation axis for automated crystallography.
13. The method as recited in claim 11 includes providing said Hall-effect switch generally centrally located between said first magnet and said second magnet.
14. The method as recited in claim 11 wherein said Hall-effect switch has an open state indicating the sample pin is not mounted on said mounting member.
15. The method as recited in claim 11 wherein said Hall-effect switch has a closed state indicating the sample pin is mounted on said mounting member.
16. The method as recited in claim 11 wherein said mounting member includes a goniometer.
17. The method as recited in claim 11 includes providing a supporting member engaging a mounting face of the magnetic base.
18. The method as recited in claim 17 wherein said supporting member receives said Hall-effect switch, said first magnet, and said second magnet.
19. The method as recited in claim 11 wherein said supporting member is mounted to a goniometer.