Isotope ion microscope methods and systems
Ion microscope methods and systems are disclosed. In general, the systems and methods involve relatively light isotopes, minority isotopes or both. In some embodiments, He-3 is used.
1. A method, comprising:
selecting a first gas to be used in gas assisted chemistry of a sample;
using a gas field ion source to form a beam of ions of an isotope of a noble gas; and
interacting ions of the isotope of the noble gas in the beam of ions with the first gas to perform gas assisted chemistry on the sample,
wherein:
the isotope of the noble gas is selected from the group consisting of He-3, Ne-20, Ne-22, Ar-36, Ar-38, Kr-78, Kr-80, Kr-82, Kr-83, Xe-124, Xe-126, Xe-128, Xe-129, Xe-130, Xe-131, Xe-132, Xe-134 and Xe-136; and
an amount of the ions of the isotope of the noble gas is greater than a natural abundance of the isotope of the noble gas.
2. The method of claim 1 , wherein at least 0.01% of the ions are ions of He-3, Ne-20, Ne-22, Ar-36, Ar-38, Kr-78, Kr-80, Kr-82, Kr-83, Xe-124, Xe-126, Xe-128, Xe-129, Xe-130, Xe-131, Xe-132, Xe-134 or Xe-136.
3. The method of claim 1 , wherein:
the beam of ions is a first ion beam having a first percentage of an isotope of a noble gas;
the method comprises using a field to modify the first ion beam to form a second ion beam having a second percentage of the isotope of the noble gas; and
the first percentage is different from the second percentage.
4. The method of claim 3 , wherein the second percentage is greater than the first percentage.
5. The method of claim 3 , wherein the field is at least one of a magnetic field, an electric field and multiple fields.
6. The method of claim 1 , wherein the amount of the ions of the isotope of the noble gas is at least two times the natural abundance of the isotope of the noble gas.
7. The method of claim 1 , wherein the amount of the ions of the isotope of the noble gas is at least 10 times the natural abundance of the isotope of the noble gas.
8. The method of claim 1 , wherein the amount of the ions of the isotope of the noble gas is at least 1000 times the natural abundance of the isotope of the noble gas.
9. The method of claim 1 , wherein at least 95% of the ions in the beam of ions are He-3 ions.
10. The method of claim 1 , wherein the beam of ions comprises at least 0.1% Ne ions, and less than 90% of the Ne ions are Ne-20 ions.
11. The method of claim 1 , wherein the beam of ions comprises at least 0.1% Ar ions, and less than 99.5% of the Ar ions are Ar-40 ions.
12. The method of claim 1 , wherein the beam of ions comprises at least 0.1% Kr ions, and less than 55% of the Kr ions are Kr-84 ions.
13. The method of claim 1 , wherein the beam of ions comprises at least 0.1% Xe ions, and less than 25% of the Xe are Xe-132 ions.
14. The method of claim 1 , comprising exposing a gas to an ion source to generate the ions.
15. The method of claim 1 , wherein the sample comprises a sample selected from the group consisting of a semiconductor articles, biological samples, pharmaceutical samples, frozen water, read/write heads, metal samples and alloy samples.
16. The method of claim 1 , comprising exposing the sample to the ions to cause particles to leave the sample, and detecting the particles to determine information about the sample.
17. The method of claim 1 , wherein the ions sputter the sample.
18. The method of claim 1 , wherein the sample comprises a mask, and the method repairs the mask.
19. The method of claim 1 , wherein the sample comprises a semiconductor article and the method repairs a circuit by adding material to the sample or removing material from the sample.
20. The method of claim 16 , wherein the particles that leave the sample are secondary electrons, and the method includes determining a total abundance of the secondary electrons.
21. The method of claim 16 , wherein the particles that leave the sample are scattered ions, and the method includes determining energy-resolved information about the electrons scattered ions.
22. The method of claim 16 , wherein the particles that leave the sample are scattered ions, and the method includes determining angle-resolved information about the scattered ions.
23. A method, comprising:
using a gas field ion source to form a beam of ions of an isotope of a noble gas; and
using ions of the isotope of the noble gas in the beam of ions to repair a mask,
wherein:
the isotope of the noble gas is selected from the group consisting of He-3, Ne-20, Ne-22, Ar-36, Ar-38, Kr-78, Kr-80, Kr-82, Kr-83, Xe-124, Xe-126, Xe-128, Xe-129, Xe-130, Xe-131, Xe-132, Xe-134 and Xe-136; and
an amount of the ions of the isotope of the noble gas is greater than a natural abundance of the isotope of the noble gas.
24. A method, comprising:
using a gas field ion source to form a beam of ions of an isotope of a noble gas; and
using ions of the isotope of the noble gas in the beam of ions to add material to a semiconductor article to repair a circuit in the semiconductor article,
wherein:
the isotope of the noble gas is selected from the group consisting of He-3, Ne-20, Ne-22, Ar-36, Ar-38, Kr-78, Kr-80, Kr-82, Kr-83, Xe-124, Xe-126, Xe-128, Xe-129, Xe-130, Xe-131, Xe-132, Xe-134 and Xe-136; and
an amount of the ions of the isotope of the noble gas is greater than a natural abundance of the isotope of the noble gas.
25. A method, comprising:
using a gas field ion source to form a beam of ions of an isotope of a noble gas; and
using ions of the isotope of the noble gas in the beam of ions to remove material from a semiconductor article to repair a circuit in the semiconductor article,
wherein:
the isotope of the noble gas is selected from the group consisting of He-3, Ne-20, Ne-22, Ar-36, Ar-38, Kr-78, Kr-80, Kr-82, Kr-83, Xe-124, Xe-126, Xe-128, Xe-129, Xe-130, Xe-131, Xe-132, Xe-134 and Xe-136; and
an amount of the ions of the isotope of the noble gas is greater than a natural abundance of the isotope of the noble gas.