Non-volatile semiconductor memory device

1. A non-volatile semiconductor memory device comprising:

a memory cell array, the memory cell array comprising a memory string including a plurality of memory cells connected in series, a first select transistor connected to one end of the memory string, a second select transistor connected to the other end of the memory string, a bit line connected to the memory string via the first select transistor, a source line connected to the memory string via the second select transistor, and word lines connected to control gate electrodes of the memory cells, respectively; and

a control unit being configured to control a repeat of an erase operation, an erase verify operation, and a step-up operation, the erase operation being an operation of applying an erase voltage to the memory cells for data erase, the erase verify operation being an operation of determining whether the data erase is completed, the step-up operation being an operation of raising the erase voltage by a first step-up value when the data erase is not completed,

the control unit being configured to perform a soft-programming operation of setting the memory cells from an over-erased state to a first threshold voltage distribution state when, in a series of erase operations, a number of erase voltage applications is more than a first number and less than a second number (the first number<the second number) and

the control unit being configured not to perform the soft-programming operation when the number of erase voltage applications is equal to or less than the first number or equal to or more than the second number.

2. The non-volatile semiconductor memory device according to claim 1 , wherein

when the number of erase voltage applications becomes more than a third number in a series of erase operations, the control unit changes the first step-up value.

3. The non-volatile semiconductor memory device according to claim 2 , wherein

the control unit increases the first step-up value.

4. The non-volatile semiconductor memory device according to claim 2 , wherein

the control unit decreases the first step-up value.

5. The non-volatile semiconductor memory device according to claim 1 , wherein

when an upper limit of a threshold voltage distribution of the memory cells becomes less than a first erase verify voltage value, the control unit changes the first step-up value.

6. The non-volatile semiconductor memory device according to claim 5 , wherein

the control unit increases the first step-up value.

7. The non-volatile semiconductor memory device according to claim 5 , wherein

the control unit decreases the first step-up value.

8. The non-volatile semiconductor memory device according to claim 1 , wherein

the control unit is configured to be capable of changing a set voltage during of the erase verify operation according to the number of erase voltage applications in a series of erase operations.

9. The non-volatile semiconductor memory device according to claim 8 , wherein

when the set voltage during of the erase verify operation is changed, the control unit is configured to be capable of changing a the set voltage of the soft-programming operation.

10. A non-volatile semiconductor memory device comprising:

a memory cell array, the memory cell array comprising a memory string including a plurality of memory cells connected in series, a first select transistor connected to one end of the memory string, a second select transistor connected to the other end of the memory string, a bit line connected to the memory string via the first select transistor, a source line connected to the memory string via the second select transistor, and word lines connected to control gate electrodes of the memory cells, respectively; and

a control unit being configured to control a repeat of an erase operation, an erase verify operation, and a step-up operation, the erase operation being an operation of applying an erase voltage to the memory cells for data erase, the erase verify operation being an operation of determining whether the data erase is completed, the step-up operation being an operation of raising the erase voltage by a first step-up value when the data erase is not completed,

the control unit being configured to be capable of controlling whether to perform a soft-programming operation of setting the memory cells from an over-erased state to a first threshold voltage distribution state according to a number of the erase operations in a series of the repeat of the erase operation, the erase verify operation, and the step-up operation.

11. The non-volatile semiconductor memory device according to claim 10 , wherein

when the number of the erase operations becomes more than a first number in a series of the repeat of the erase operation, the erase verify operation, and the step-up operation, the control unit changes the first step-up value.

12. The non-volatile semiconductor memory device according to claim 10 , wherein

when an upper limit of a threshold voltage distribution of the memory cells becomes less than a first erase verify voltage value, the control unit changes the first step-up value.

13. The non-volatile semiconductor memory device according to claim 10 , wherein

the control unit is configured to be capable of changing a set voltage during the erase verify operation according to the number of the erase operations in a series of the repeat of the erase operation, the erase verify operation, and the step-up operation.

14. The non-volatile semiconductor memory device according to claim 13 , wherein

when the set voltage during the erase verify operation is changed, the control unit is configured to be capable of changing a set voltage of the soft-programming operation.

15. The non-volatile semiconductor memory device according to claim 10 , wherein

the control unit is configured to control whether to perform the soft-programming operation according to the number of the erase operations when an upper limit of a threshold voltage distribution of the memory cells becomes less than a first erase verify voltage value.