IP Library Granted Patent US 8,460,764
Granted Patent B2
US 8,460,764 · App. 12/397,894 · Granted Jun 11, 2013

Method and apparatus for producing ultra-thin graphitic layers

Inventors: Walt A. de Heer (Atlanta, GA); Xuebin Li (Santa Clara, CA); Michael Sprinkle (Mableton, GA)
Assignee: Georgia Tech Research Corporation
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Quick Facts
Patent No.
US 8,460,764
App. No.
12/397,894
Granted
Jun 11, 2013
Kind
B2
Abstract

In a method of producing ultra-thin graphitic layers, a carbide crystal is placed into a graphitic enclosure. The carbide crystal and the graphitic enclosure are placed into a chamber. The carbide crystal and the graphitic enclosure are subjected to a predetermined environment. Once the predetermined environment is established, the carbide crystal and the graphitic enclosure are heated to a first temperature for a predetermined period of time sufficient to cause at least one non-carbon element to evaporate from a crystal face of the carbide crystal so as to form at least one graphitic layer on the crystal face of the carbide crystal.

Claims (21)

1. A method of producing ultra-thin graphitic layers, comprising the actions of:

a. placing a carbide crystal into a graphitic enclosure;

b. placing the carbide crystal and the graphitic enclosure into a chamber;

c. subjecting the carbide crystal and the graphitic enclosure to a predetermined environment;

d. once the predetermined environment is established, heating the carbide crystal and the graphitic enclosure to a first temperature for a predetermined period of time sufficient to cause at least one non-carbon element to evaporate from a crystal face of the carbide crystal so as to form at least one graphitic layer on the crystal face of the carbide crystal; and

e. reacting residual gaseous reactants in the graphitic enclosure that would act as impurities in the ultra-thin graphitic layers with the graphitic enclosure so as to transform such residual gaseous reactants into substances that will not add impurities to the ultra-thin graphitic layers; and

f. placing the carbide crystal and the graphitic enclosure into a conductive receptacle, wherein the heating action includes inductively heating the conductive receptacle by applying radio frequency radiation to the conductive receptacle.

2. The method of claim 1 , wherein the conductive receptacle comprises molybdenum.

3. The method of claim 1 , further comprising the action of cleaning and flattening the crystal face of the carbide crystal.

4. The method of claim 3 , wherein the cleaning and flattening action comprises the action of hydrogen etching the crystal face.

5. The method of claim 1 , wherein the chamber comprises a vacuum chamber and wherein the predetermined environment comprises a vacuum.

6. The method of claim 1 , wherein the subjecting action comprises evacuating the chamber to a predetermined vacuum having a pressure that is less than 10 −2 Torr.

7. The method of claim 1 , wherein the first temperature is in a range from 1200° C. to 1700° C.

8. The method of claim 1 , further comprising the action of introducing an inert gas into the chamber during the heating action.

9. The method of claim 8 , wherein the inert gas comprises helium.

10. The method of claim 1 , wherein the carbide crystal comprises silicon carbide and wherein the non-carbon element comprises silicon.

11. The method of claim 1 , wherein the chamber comprises a material selected from a group consisting of: quartz, alumina and combinations thereof.

12. The method of claim 1 , further comprising the actions of:

a. placing the carbide crystal and the graphitic enclosure in a second zone of the chamber that is heated to a second temperature, different from the first temperature; and

b. moving the carbide crystal and the graphitic enclosure into a first zone of the chamber, spaced apart from the second zone, that is heated to the first temperature.

13. The method of claim 12 , further comprising the action of moving the carbide crystal and the graphitic enclosure into a third zone of the chamber, spaced apart from the first zone and the second zone that is heated to a third temperature, different from the first temperature and the second temperature.

Assignments (2)
CONFIRMATORY LICENSE Recorded Jun 1, 2010
From: GEORGIA TECH RESEARCH CORPORATION
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 024464/0450 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 26, 2009
From: DE HEER, WALT A.; LI, XUEBIN; SPRINKLE, MICHAEL
To: GEORGIA TECH RESEARCH CORPORATION
Reel/Frame 022883/0028 →
Continuity (3)
Provisional Application 61037579 · Mar 18, 2008
Provisional Application 61034240 · Mar 6, 2008
Related Publication 20090226638A1 · Sep 10, 2009