IP Library Granted Patent US 8,501,517
Granted Patent B1
US 8,501,517 · App. 13/441,928 · Granted Aug 6, 2013

Method of assembling pressure sensor device

Inventors: Kai Yun Yow (Petaling Jaya, MY); Poh Leng Eu (Petaling Jaya, MY)
Assignee: Freescale Semiconductor, Inc.
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Quick Facts
Patent No.
US 8,501,517
App. No.
13/441,928
Granted
Aug 6, 2013
Kind
B1
Abstract

A method of assembling a pressure sensor device includes providing a substrate having a plurality of substrate connection pads. A pressure sensor die is attached to a first major surface of the substrate and bond pads of the pressure sensor die are electrically connected to the respective substrate connection pads. A retractable cavity pin is placed on the first major surface of the substrate such that the cavity pin covers the pressure sensor die and the electrical connections to the die. A molding compound is then dispensed onto the first major surface of the substrate such that the molding compound surrounds the pressure sensor die and the cavity pin. The cavity pin is retracted such that a cavity is formed around the pressure sensor die and a gel material is dispensed within the cavity such that the gel material fills the cavity and covers the pressure sensor die.

Claims (39)

1. A method of assembling a pressure sensor device, comprising the steps of:

providing a substrate having a plurality of substrate connection pads;

attaching a sensor die to a first major surface of the substrate;

electrically connecting bond pads of the sensor die to the respective substrate connection pads;

placing a retractable cavity pin on the first major surface of the substrate such that the cavity pin covers the sensor die and the electrical connections thereto;

dispensing a molding compound onto the first major surface of the substrate such that the molding compound surrounds the sensor die and the cavity pin;

retracting the cavity pin, whereby a cavity around the sensor die is formed; and

dispensing a gel material within the cavity, wherein the gel material substantially fills the cavity and covers the sensor die.

2. The method of assembling a pressure sensor device of claim 1 , wherein the substrate comprises a flexible printed circuit board.

3. The method of assembling a pressure sensor device of claim 1 , wherein the sensor die comprises a piezo resistive transducer (PRT) semiconductor die.

4. The method of assembling a pressure sensor device of claim 1 , further comprising attaching one or more additional semiconductor dies to the first major surface of the substrate prior to placing the cavity pin, wherein the molding compound encapsulates the one or more additional semiconductor dies.

5. The method of assembling a pressure sensor device of claim 4 , further comprising electrically connecting the one or more additional semiconductor dies to respective substrate pads.

6. The method of forming a pressure sensor device of claim 5 , further comprising electrically connecting the one or more additional semiconductor dies to the sensor die.

7. The method of assembling a pressure sensor device of claim 4 , wherein the one or more additional semiconductor dies comprise G-cell and microcontroller (MCU) dies.

8. The method of assembling a pressure sensor device of claim 7 , further comprising attaching a lid to the substrate to cover the sensor die.

9. The method of assembling a pressure sensor device of claim 1 , wherein the bond pads of the sensor die are electrically connected to the substrate pads with wires using a wire bonding process.

10. The method of assembling a pressure sensor package of claim 1 , further comprising curing the molding compound prior to retracting the cavity pin.

11. A method of assembling a pressure sensor device, comprising the steps of:

providing a substrate having a plurality of substrate connection pads;

attaching one or more semiconductor dies to a first major surface of the substrate;

electrically connecting bond pads of the one or more semiconductor dies to respective substrate connection pads of the substrate;

placing a retractable cavity pin on the first major surface of the substrate;

dispensing a molding compound onto the first major surface of the substrate such that the molding compound surrounds the one or more semiconductor dies and the cavity pin;

retracting the cavity pin, whereby a cavity is formed; and

attaching a pressure sensor die to a die-attach area within the cavity and electrically connecting bond pads of the pressure sensor die to the respective substrate connection pads; and

dispensing a gel material within the cavity such that the gel material substantially fills the cavity and covers the pressure sensor die.

12. The method of assembling a pressure sensor device of claim 11 , wherein the substrate comprises a flexible printed circuit board.

13. The method of assembling a pressure sensor device of claim 11 , wherein the pressure sensor die comprises a piezo resistive transducer (PRT) semiconductor die.

14. The method of assembling a pressure sensor device of claim 11 , wherein the one or more semiconductor dies comprise G-cell and microcontroller (MCU) dies.

15. A method of assembling a pressure sensor device, comprising the steps of:

providing a substrate having a plurality of electrical connection pads on a first major surface of the substrate;

attaching a pressure sensor die and one or more additional semiconductor dies to the first major surface of the substrate with a die attach adhesive;

electrically connecting bond pads of each of the pressure sensor die and the one or more additional semiconductor dies to the substrate connection pads with bond wires;

placing a retractable cavity pin over the pressure sensor die and the electrical connections thereto;

dispensing a molding compound onto the first major surface of the substrate, wherein the molding compound covers the one or more additional semiconductor dies and the electrical connections thereto;

retracting the cavity pin, whereby a cavity is formed around the pressure sensor die; and

dispensing a gel material within the cavity such that the gel material substantially fills the cavity and covers the pressure sensor die.

16. The method of assembling a pressure sensor device of claim 15 , further comprising attaching a lid to the substrate with a lid attach adhesive, wherein the lid covers the pressure sensor die and the gel material.

17. The method of assembling a pressure sensor device of claim 16 , further comprising electrically connecting the pressure sensor die to the one or more additional semiconductor dies with additional bond wires before placing the retractable cavity pin over the pressure sensor die.

Assignments (23)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 12, 2026
From: NXP USA, INC.
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 075045/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0535 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0575 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0555 →
SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 031591/0266 →
SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030633/0424 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030258/0501 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 22, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 030258/0479 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Apr 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 030256/0706 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2012
From: YOW, KAI YUN; EU, POH LENG
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 028009/0883 →