Test apparatus and test method
Provided is a test apparatus and a test method for substantially synchronizing phases of test signals for each of a plurality of clock domains. The test apparatus tests a device under test including a plurality of clock domains. The test apparatus comprises a period generator that generates a rate signal for determining a test period corresponding to an operation period of the device under test; a pattern generator that generates a test pattern; phase comparing sections that, for each clock domain, receive an operation clock signal of the clock domain acquired from a terminal of the device under test included in the clock domain, and detect a phase difference of the operation clock signal of the clock domain with respect to the rate signal; and a plurality of waveform shaping sections that are provided respectively to the clock domains, and that each shape a test signal based on the test pattern, according to the phase difference of the corresponding clock domain, to substantially synchronize the test signal with the operation clock signal of the corresponding clock domain.
1. A test apparatus that tests a device under test including a plurality of clock domains, the test apparatus comprising:
a period generator that generates a rate signal for determining a test period corresponding to an operation period of the device under test;
a pattern generator that generates a test pattern;
phase comparing sections that, for each clock domain, receive an operation clock signal of the clock domain acquired from a terminal of the device under test included in the clock domain, and detect a phase difference of the operation clock signal of the clock domain with respect to the rate signal; and
a plurality of waveform shaping sections that are provided respectively to the clock domains, and that each shape a test signal based on the test pattern, according to the phase difference of the corresponding clock domain, to substantially synchronize the test signal with the operation clock signal of the corresponding clock domain.
2. The test apparatus according to claim 1 , further comprising a control table that stores, in association with each of a plurality of addresses, enable information or disable information for enabling or disabling operation of the phase comparing section and the waveform shaping section of each clock domain, wherein
the operation of the phase comparing sections or the waveform shaping sections is dynamically controlled according to designation of the addresses by a test program for shaping the test signals.
3. The test apparatus according to claim 2 , further comprising an address pointer that stores the addresses, wherein
a pointer value of the address pointer is incremented or decremented by control commands designated by the test program to dynamically control the operation of the phase comparing sections or the waveform shaping sections.
4. The test apparatus according to claim 3 , further comprising a delay amount storage section that stores delay amounts for the waveform shaping sections, wherein
each waveform shaping section repeats a delay operation using a delay amount stored in the delay amount storage section one or more times to shape the test signal according to the phase difference.
5. The test apparatus according to claim 4 , further comprising a plurality of test signal output sections that correspond respectively to the clock domains and that each supply the device under test with a delayed test signal of the corresponding clock domain, wherein
the control table further stores, in association with each of the addresses, enable information or disable information for enabling or disabling operation of the test signal output section of each clock domain.
6. The test apparatus according to claim 2 , further comprising a second control table that stores, in association with each of a plurality of addresses, table enable information or table disable information for enabling or disabling the control table, wherein
for addresses corresponding to table enable information stored in the second control table, when every corresponding address in the control table stores enable information or when one of the corresponding addresses in the control table stores enable information, the operation of the phase comparing sections or the waveform shaping sections is enabled.
7. A test method for testing a device under test including a plurality of clock domains, the test method comprising:
generating a rate signal for determining a test period corresponding to an operation period of the device under test;
generating a test pattern;
for each clock domain, receiving an operation clock signal of the clock domain acquired from a terminal of the device under test included in the clock domain, and detecting a phase difference of the operation clock signal of each domain clock with respect to the rate clock; and
for each clock domain, forming a test signal based on the test pattern, according to the phase difference of the corresponding clock domain, to substantially synchronize the test signal with the operation clock signal of the corresponding clock domain.