IP Library Granted Patent US 8,558,329
Granted Patent B2
US 8,558,329 · App. 12/945,077 · Granted Oct 15, 2013

Piezo-phototronic sensor

Inventors: Zhong L. Wang (Marietta, GA); Youfan Hu (Atlanta, GA); Yan Zhang (Atlanta, GA)
Assignee: Georgia Tech Research Corporation
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Quick Facts
Patent No.
US 8,558,329
App. No.
12/945,077
Granted
Oct 15, 2013
Kind
B2
Abstract

A device includes a substrate having a first surface. A piezoelectric nanowire is disposed on the first surface of the substrate. The piezoelectric nanowire has a first end and an opposite second end. The piezoelectric nanowire is subjected to an amount of strain. A first Schottky contact is in electrical communication with the first end of the piezoelectric nanowire. A second Schottky contact is in electrical communication with the second end of the piezoelectric nanowire. A bias voltage source is configured to impart a bias voltage between the first Schottky contact and the second Schottky contact. A mechanism is configured to measure current flowing through the piezoelectric nanowire. The amount of strain is selected so that a predetermined current will flow through the piezoelectric nanowire when light of a selected intensity is applied to a first location on the piezoelectric nanowire.

Claims (12)

1. A device for detecting light of an intensity, comprising:

a. a substrate having a first surface;

b. a piezoelectric nanowire disposed on the first surface of the substrate, the piezoelectric nanowire having a first end and an opposite second end, the piezoelectric nanowire subjected to a predetermined amount of strain that causes the piezoelectric nanowire to allow current to flow therethrough when the light is applied to a first location on the piezoelectric nanowire;

c. a first Schottky contact in electrical communication with the first end of the piezoelectric nanowire;

d. a second Schottky contact in electrical communication with the second end of the piezoelectric nanowire;

e. a bias voltage source configured to impart a bias voltage between the first Schottky contact and the second Schottky contact; and

f. a mechanism configured to measure current flowing through the piezoelectric nanowire, so that the current flowing though the piezoelectric nanowire corresponds to the intensity of light.

2. The device of claim 1 , wherein the substrate comprises a polymer.

3. The device of claim 2 , wherein the polymer comprises polystyrene.

4. The device of claim 1 , wherein the nanowire comprises a zinc oxide nanowire.

5. The device of claim 1 , wherein the amount of strain is in a range of 2% tensile strain to −2% compressive strain.

6. The device of claim 1 , wherein the substrate has a thickness, wherein the piezoelectric nanowire has a diameter and wherein the thickness of the substrate is substantially greater than the diameter of the nanowire.

Assignments (2)
CONFIRMATORY LICENSE Recorded Jul 14, 2021
From: GEORGIA INSTITUTE OF TECHNOLOGY
To: UNITED STATES DEPARTMENT OF ENERGY
Reel/Frame 056927/0779 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 1, 2011
From: WANG, ZHONG L.; HU, YOUFAN; ZHANG, YAN
To: GEORGIA TECH RESEARCH CORPORATION
Reel/Frame 025880/0626 →
Continuity (2)
Provisional Application 61261033 · Nov 13, 2010
Related Publication 20120153860A1 · Jun 21, 2012