IP Library Granted Patent US 8,618,643
Granted Patent B2
US 8,618,643 · App. 13/177,257 · Granted Dec 31, 2013

Semiconductor device and lead frame used for the same

Inventor: Yoshiaki Goto (Nishikasugai-gun, JP)
Assignee: Kabushiki Kaisha Toshiba
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Quick Facts
Patent No.
US 8,618,643
App. No.
13/177,257
Granted
Dec 31, 2013
Kind
B2
Abstract

A lead frame includes a first outer lead portion and a second outer lead portion which is arranged to oppose to the first outer lead portion with an element-mounting region between them. An inner lead portion has first inner leads connected to the first outer leads and second inner leads connected to the second outer leads. At least either the first or second inner leads are routed in the element-mounting region. An insulation resin is filled in the gaps between the inner leads located on the element-mounting region. A semiconductor device is configured with semiconductor elements mounted on both the top and bottom surfaces of the lead frame.

Claims (46)

1. A lead frame, comprising:

an element-mounting region;

an outer lead portion having a plurality of outer leads;

an inner lead portion having a plurality of inner leads, at least part of the inner leads being routed in the element-mounting region; and

an element supporting portion provided in a region other than a region where the inner leads are present in the element-mounting region,

wherein the element supporting portion has a plurality of first hanging leads provided at a first long edge side of a rectangular region of the lead frame sealed with a resin, and a second hanging lead provided at a second long edge side of the sealed rectangular region,

wherein the first hanging leads extend from the element supporting portion to the first long edge side of the sealed rectangular region,

wherein the second hanging lead extends from the element supporting portion to the second long edge side of the sealed rectangular region,

wherein the outer leads are arranged at first and second short edge sides of the sealed rectangular region,

wherein one end of the inner leads is arranged at the second long edge side of the sealed rectangular region,

wherein a part of the inner leads has: a first portion extended to the one end of the inner leads, a second portion extended to the outer leads arranged at the first short edge side of the sealed rectangular region, and a third portion routed in the element-mounting region so as to extend in a direction which intersects the first and second portions,

wherein another part of the inner leads has: a fourth portion extended to the one end of the inner leads, a fifth portion extended to the outer leads arranged at the second short edge side of the sealed rectangular region, and a sixth portion routed in the element-mounting region so as to extend in a direction which intersects the fourth and fifth portions, and

wherein the element supporting portion is provided in a region between the third portion and the sixth portion.

2. The lead frame according to claim 1 ,

wherein the element supporting portion has an opening.

3. The lead frame according to claim 2 ,

wherein the opening has an elongate shape, and a longer direction of the opening corresponds to a direction of the long edge of the sealed rectangular region.

4. A semiconductor device, comprising:

the lead frame according to claim 1 ;

at least one semiconductor element having a first surface mounted on the element-mounting region of the lead frame, and a second surface including electrode pads;

metal wires electrically connecting the inner leads of lead frame and the electrode pads; and

a resin-sealed portion sealed the semiconductor element together with the metal wires.

5. The semiconductor device according to claim 4 ,

wherein an insulation resin is filled into gaps between the inner leads located on at least part of the element-mounting region of the lead frame, and

wherein the semiconductor element comprises a first semiconductor element mounted on the element-mounting region in a first surface of the lead frame, and a second semiconductor element mounted on the element-mounting region in a second surface of the lead frame.

6. The semiconductor device according to claim 5 ,

wherein the element supporting portion has an opening.

7. The semiconductor device according to claim 5 ,

wherein the first hanging leads are located between the third portion and the sixth portion in the first long edge side of the sealed rectangular region.

8. The semiconductor device according to claim 5 ,

wherein the second hanging lead is located between the first portion and the fourth portion in the second long edge side of the sealed rectangular region.

9. The semiconductor device according to claim 5 ,

wherein at least part of the element supporting portion is provided in at least one of a region where is a side of the outer lead from the first portion and a opposite side of the one end of the inner lead from the third portion, and a region where is a side of the outer lead from the fourth portion and a opposite side of the one end of the inner lead from the sixth portion.

10. The lead frame according to claim 1 ,

wherein the first hanging leads are located between the third portion and the sixth portion in the first long edge side of the sealed rectangular region.

11. The lead frame according to claim 1 ,

wherein the second hanging lead is located between the first portion and the fourth portion in the second long edge side of the sealed rectangular region.

12. The lead frame according to claim 1 ,

wherein at least part of the element supporting portion is provided in at least one of a region where is a side of the outer lead from the first portion and a opposite side of the one end of the inner lead from the third portion, and a region where is a side of the outer lead from the fourth portion and a opposite side of the one end of the inner lead from the sixth portion.

13. The lead frame according to claim 1 , wherein:

the first hanging leads extend from the element supporting portion through the first long edge side of the sealed rectangular region to connect the element supporting portion to a portion of the lead frame that is outside of the sealed rectangular region, and

the second hanging lead extends from the element supporting portion through the second long edge side of the sealed rectangular region to connect the element supporting portion to a portion of the lead frame that is outside of the sealed rectangular region.

14. The lead frame according to claim 4 ,

wherein the one end of the inner leads protrudes outside the semiconductor element, and the metal wires are connected to surfaces of the inner leads on which the semiconductor element is mounted.

15. The lead frame according to claim 4 ,

wherein a distance from the electrode pads to the second long edge side of the sealed rectangular region is longer than a distance from connecting points of the metal wires and the inner leads to the second long edge side of the sealed rectangular region.

Assignments (4)
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 042940/0376 →
Priority Claims (1)
JP 2007-268775 · Oct 16, 2007 · national
Continuity (2)
Continuation 12252584 · Oct 16, 2008
Related Publication 20110260312A1 · Oct 27, 2011