IP Library › Granted Patent US 8,654,996
Granted Patent B2
US 8,654,996 · App. 13/145,019 · Granted Feb 18, 2014

Spacer for a capacitive microphone and capacitive microphone with the same

Inventor: Rongguo Yao (Weifang, CN)
Assignee: Goertek Inc.
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Quick Facts
Patent No.
US 8,654,996
App. No.
13/145,019
Granted
Feb 18, 2014
Kind
B2
Abstract

The present invention relates to a spacer for a capacitive microphone and a capacitive microphone with such spacer, in which the spacer is mounted between polar plates and vibrating diaphragm of the microphone and the spacer comprises at least one insulating layer and at least one conductive layer bonded with the insulating layer. With the above-mentioned structure, static electricity is effectively prevented from occurring or storing during manufacturing process of the spacer and meanwhile, disadvantages such as difficult processing, high cost and tendency to increase parasitic capacitance while making spacer with metal sheet are overcome.

Claims (9)

1. A spacer for a capacitive microphone, said capacitive microphone comprising one or more polar plates and a vibrating diaphragm, said spacer is mounted between the polar plates and the vibrating diaphragm, the spacer comprises at least one insulating layer and at least one conductive layer bonded with the insulating layer, wherein the insulating layer is an organic material layer, the conductive layer is a quasi-metallization layer or a metal layer; and the spacer has a ring-shaped structure and a plurality of connecting ribs are provided on periphery of the spacer.

2. The spacer for a capacitive microphone of claim 1 , wherein the spacer comprises a first organic material layer, a first metal layer is provided on one side of the first organic material layer.

3. The spacer for a capacitive microphone of claim 2 , wherein the first metal layer has a thickness of 0.001 mm˜0.01 mm.

4. The spacer for a capacitive microphone of claim 2 , wherein the first organic material layer has a thickness of 0.01 mm˜0.1 mm.

5. The spacer for a capacitive microphone of claim 1 , wherein the spacer has a ring-shaped structure and a periphery of the spacer is of square shape.

6. The spacer for a capacitive microphone of claim 1 , wherein the insulating layer is an organic high molecular material layer, and the conductive layer is a conductive layer formed by conducting antistatic treatment on a surface of the organic high molecular material with proton bombardment technology in plasma environment.

7. The spacer for a capacitive microphone of claim 1 , wherein the organic material layer is an organic high molecular material layer, and the quasi-metallization layer or the metal layer is implemented by bombarding the organic high molecular material layer with metal ions so as to metallize or quasi-metallize a surface of the organic high molecular material layer.

8. The spacer for a capacitive microphone of claim 1 , wherein the organic material layer is an organic high molecular material layer, and the metal layer is implemented by depositing a metal on the organic high molecular material layer with a wet chemical method.

9. A capacitive microphone, wherein the capacitive microphone comprises the spacer of any one of claims 1 - 4 and 5 - 8 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 15, 2020
From: GOERTEK INC.
To: GOERTEK MICROELECTRONICS CO., LTD
Reel/Frame 052937/0044 →
Priority Claims (1)
CN 2009 2 0018530 U · Jan 19, 2009 · national
Continuity (1)
Related Publication 20110274300A1 · Nov 10, 2011