Controlling dynamic and thermal loads on laser beam positioning system to achieve high-throughput laser processing of workpiece features
View Patent ↗A method of accomplishing high-throughput laser processing of workpiece features arranged in a densely spaced pattern minimizes workpiece feature processing inaccuracy and quality degradation that result from dynamic and thermal loads on laser beam positioning and optical components directing the laser beam during workpiece feature processing. A preferred embodiment is implemented with a laser beam positioning system composed of a zero-inertia optical deflector of an acousto-optic beam deflector (AOD) or an electro-optical deflector (EOD) type, a galvanometer head, and a linear stage cooperating to position the laser beam among the workpiece features.
1. A method of accomplishing high-throughput laser processing of workpiece features arranged in a densely spaced pattern while minimizing workpiece feature processing inaccuracy and quality degradation that result from dynamic and thermal loads on laser beam positioning and optical components directing the laser beam during workpiece feature processing, comprising:
positioning a workpiece on a support, the workpiece having a process surface that defines a process surface area;
directing a laser beam to a beam positioning system to provide a processing laser beam for incidence at feature locations on the process surface of the workpiece, the beam positioning system including a movable stage and first and second beam positioners that cooperate with the movable stage to process in a densely spaced pattern workpiece features at the feature locations on the process surface of the workpiece, the first beam positioner including an optical beam deflector surface mechanism that has a light beam-receiving surface with a center location and is characterized by a first response time, the optical beam deflection surface mechanism operable to position the processing laser beam within a scan field region of the process surface, and the second beam positioner including a zero-inertia optical deflector that receives and deflects the laser beam to produce a deflected output beam propagating to impinge on the light beam-receiving surface, is characterized by a second response time, and is operable to move the processing beam to locations within the scan field region, the second response time being shorter than the first response time;
causing the deflected output beam to impinge on the light beam-receiving surface substantially at the center location to control distortion of the scan field region of the process surface of the workpiece; and
controlling the beam positioning system to coordinate operation of the movable stage and the first beam positioner to position the processing laser beam within the scan field region and move the scan field region to cover the process surface, the scan field region being substantially smaller than the process surface area of the workpiece and including multiple processing bands that each encompass multiple feature locations; to operate the optical beam deflection surface mechanism of the first beam positioner to successively position the processing laser beam to the multiple processing bands within the scan field region; and to operate the second beam positioner to process the workpiece features at the multiple feature locations in each of the processing bands by moving the processing laser beam to and dwelling the processing laser beam at each feature location to process the workpiece features in the processing band, so that the first beam positioner undergoes negligible acceleration and deceleration during workpiece feature processing within the scan field region.
2. The method of claim 1 , in which the workpiece is a silicon wafer patterned with an array of solar cells.
3. The method of claim 1 , in which the first beam positioner includes a mirror-based beam positioner.
4. The method of claim 3 , in which the mirror-based beam positioner includes a two-axis galvanometer beam positioner head.
5. The method of claim 3 , in which the mirror-based beam positioner includes a two-axis fast steering mirror.
6. The method of claim 1 , in which the movable stage supports the first beam positioner and the zero-inertia optical deflector.
7. The method of claim 1 , in which the movable stage includes first and second linear stage components that move in orthogonal directions, the first linear stage component supporting the first beam positioner and the zero-inertia optical deflector, and the second linear stage component including the support on which the workpiece is positioned.
8. The method of claim 1 , in which the zero-inertia optical deflector includes an acousto-optic deflector that operates to describe a line of action as the processing band.
9. The method of claim 1 , in which the zero-inertia optical deflector includes an electro-optical deflector that operates to describe a line of action as the processing band.
10. The method of claim 1 , in which the zero-inertia optical deflector is a component of a one-dimensional scanning architecture and includes an acousto-optic deflector or an electro-optic deflector that operates to describe a line of action as the processing band, and in which the processing laser beam dwells at each feature location to process the workpiece features in the line of action by punching with a number of laser pulses.
11. The method of claim 1 , in which positioning of a relay lens along an optical path between the first and second beam positioners causes the deflected output beam to impinge on the light beam-receiving surface substantially at the center location to control distortion of the scan field region.
12. The method of claim 1 , in which the processing band has a length, and further comprising controlling the beam positioning system to operate the first beam positioner to slew and thereby extend the processing band as the second beam positioner moves and dwells the processing laser beam to process the workpiece features in the processing band, thereby to reduce time of movement of the first beam positioner as it moves the scan field region as a contribution to an overall time that is consumed to cover the process surface of the workpiece.
13. The method of claim 1 , in which the zero-inertia optical deflector is a component of a two-dimensional scanning architecture and includes two acousto-optic deflectors or two electro-optic deflectors, and in which the processing laser beam dwells at each feature location to process the workpiece features in the processing band by punching with a number of laser pulses.
14. The method of claim 1 , in which the zero-inertia optical deflector is a component of a two-dimensional scanning architecture and includes two acousto-optic deflectors or two electro-optical deflectors, and in which the processing beam dwells at each feature location to process the workpiece features in the processing band by trepan processing of the workpiece features.
15. The method of claim 1 , in which the zero-inertia optical deflector is a component of a two-dimensional scanning architecture and includes two acousto-optic deflectors or two electro-optical deflectors, and in which the processing beam dwells at each feature location to process the workpiece features in the processing band by spiral processing of the workpiece features.
16. The method of claim 1 , in which the processing laser beam includes a number of laser pulses to process one of the workpiece features, and further comprising determining the number of laser pulses as a function of the feature location of the feature undergoing processing along the processing band in the scan field region, thereby to further optimize time that is consumed by the processing laser beam processing workpiece features within the scan field region.
17. The method of claim 1 , in which the processing laser beam is characterized by a laser power to process one of the workpiece features, and further comprising determining the laser power as a function of the feature location of the feature undergoing processing along the processing band in the scan field region, thereby to further optimize time that is consumed by the processing laser beam processing workpiece features within the scan field region.