IP Library › Granted Patent US 8,680,477
Granted Patent B2
US 8,680,477 · App. 13/501,589 · Granted Mar 25, 2014

Non-destructive inspection method and device

Inventors: Hiroyuki Nose (Tokyo, JP); Hajime Kuwabara (Tokyo, JP); Tetsuya Kobayashi (Tokyo, JP)
Assignee: IHI Corporation
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Quick Facts
Patent No.
US 8,680,477
App. No.
13/501,589
Granted
Mar 25, 2014
Kind
B2
Abstract

A method of non-destructive inspection of a subject body including one or more elements comprises irradiating the subject body with a neutron ray along an axis line passing through a reference point; synchronously detecting gamma rays from directions inclined at equal angles to the axis line at a plurality of measurement points disposed to have equivalent intervals radially from the axis line, respectively; measuring the detected gamma rays in a plurality of energy ranges; determining whether measured values in the respective energy ranges are beyond thresholds; determining energy ranges where all the measured values are beyond the thresholds; analyzing a type of an element from the determined energy ranges; and detecting a location of the analyzed type of the element in the subject body on the basis of the reference point, the respective measurement points, a relative position relative to a surface of the subject body, and the directions.

Claims (18)

1. A method of non-destructive inspection of a subject body including one or more elements, comprising the steps of:

irradiating the subject body with a neutron ray along an axis line passing through a reference point;

synchronously detecting gamma rays from directions inclined at equal angles to the axis line at a plurality of measurement points disposed to have equivalent intervals radially from the axis line, respectively;

measuring the detected gamma rays in a plurality of energy ranges;

determining whether measured values in the respective energy ranges are beyond thresholds;

determining energy ranges where all the measured values are beyond the thresholds;

analyzing a type of an element from the determined energy ranges; and

detecting a location of the analyzed type of the element in the subject body on the basis of the reference point, the respective measurement points, a relative position relative to a surface of the subject body, and the directions.

2. The method of claim 1 , wherein a position radiating the neutron ray relative to the subject body is successively changed along the surface of the subject body to execute the respective steps.

3. The method of claim 1 , wherein one selected from the group consisting of a distance from the reference point to the subject body along the axis line, a distance from the axis line to the respective measurement points, and the direction of the gamma ray, is successively changed to execute the respective steps.

4. A device of non-destructive inspection of a subject body including one or more elements, comprising:

a neutron ray source having a reference point and disposed so as to irradiate the neutron ray along an axis line passing through the reference point;

a plurality of gamma ray monitors configured to respectively detect gamma rays from directions inclined at equal angles to the axis line, the gamma ray monitors being disposed at a plurality of measurement points having equivalent intervals radially from the axis line;

a plurality of wave height analyzers configured to respectively measure the detected gamma rays in a plurality of energy ranges respectively, the wave height analyzers being respectively electrically connected with the gamma ray monitors;

a controller configured to determine whether measured values in each energy ranges are beyond thresholds or not, determine an energy range where all of the measured values are beyond the thresholds, analyze a type of an element from the determined energy range, and detect a location of the analyzed type of the element in the subject body on the basis of the reference point, the respective measurement points, a relative position relative to a surface of the subject body, and the directions.

5. The device of claim 4 , wherein the respective gamma ray monitors are configured to be capable of changing one selected from the group consisting of a distance from the reference point to the subject body along the axis line, a distance of the respective measurement points from the axis line, and the direction of the gamma ray.

6. The device of claim 4 , further comprising:

a mobile pedestal configured to be movable on the subject body, on the mobile pedestal the neutron ray source and the respective gamma ray monitors are installed.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 17, 2012
From: NOSE, HIROYUKI; KUWABARA, HAJIME; KOBAYASHI, TETSUYA
To: IHI CORPORATION
Reel/Frame 028059/0561 →
Priority Claims (1)
JP 2009-238332 · Oct 15, 2009 · national
Continuity (1)
Related Publication 20120199754A1 · Aug 9, 2012