Optical measurement apparatus and method therefor
An optical measurement apparatus comprises an optical system ( 100 ) having a receiving axis ( 115 ). The optical system ( 100 ) comprises a source ( 102 ) that generates a probe beam that is directed to a location to be measured ( 114 ). A detector ( 112 ) of the optical system receives a reflected beam from the location to be measured ( 114 ). The apparatus also comprises a processing resource that receives an output signal from the detector ( 112 ) and makes an assessment of a characteristic of the output signal in order to determine a degree of alignment of the location to be measured ( 114 ) with the receiving axis ( 115 ) of the optical system ( 100 ).
1. An optical measurement apparatus comprising:
an optical system comprising:
a source arranged to generate, when in use, a probe beam, the optical system being arranged to direct, when in use, the probe beam to a location to be measured;
a detector arranged to receive, when in use, a reflected beam from the location to be measured; and
a receiving axis;
wherein the apparatus further comprises:
a processing resource operably coupled to the detector and capable of assessing when in use, a characteristic of an output generated by the detector, assessment of the characteristic of the output corresponding to an assessment of degree of alignment of the location to be measured with the receiving axis of the optical system; and
a store for storing reference profile data corresponding to at least part of a profile and/or reference characteristic data relating thereto, the reference profile data and/or the reference characteristic data corresponding to a state of alignment with the optical system;
wherein the processing resource is arranged to make the assessment of the degree of alignment based upon comparison of at least part of the signal profile and/or characteristic data relating thereto in respect of the output measured and the stored reference profile data and/or the stored reference characteristic data.
2. An apparatus as claimed in claim 1 , wherein the assessment of the characteristic of the output is assessment of a parameter measured and corresponding to the characteristic of the output.
3. An apparatus as claimed in claim 1 , wherein:
the processing resource is arranged to provide feedback information indicative of the degree of alignment of the location to be measured with the receiving axis, the feedback information being based upon the assessment of the characteristic of the output.
4. An apparatus as claimed in claim 3 , wherein the location to be measured is a location of a feature of an eye having a first axis and a second axis, the processing resource being arranged to provide feedback to obtain a misalignment of the first axis with the receiving axis in order to achieve alignment of the second axis with the receiving axis.
5. An apparatus as claimed in claim 3 , wherein the feedback information is an audible or visual indication of alignment.
6. An apparatus as claimed in claim 1 , wherein the location to be measured is a location of a feature of an eye and the probe beam is invisible to the eye.
7. An apparatus as claimed in claim 1 , wherein the processing resource is arranged to perform a measurement in respect of the reflected beam and generate a first measure of the characteristic of the output.
8. An apparatus as claimed in claim 7 , wherein the processing resource is arranged to generate a second measure of another characteristic of the output.
9. An apparatus as claimed in claim 7 , wherein the first measure is used to provide a coarse indication of the degree of alignment of the location to be measured with the optical system.
10. An apparatus as claimed in claim 8 , wherein the second measure is used to provide a fine indication of the degree of alignment of the location to be measured with the optical system.
11. An apparatus as claimed in claim 1 , further comprising a store for storing data corresponding to a state of substantially optimum alignment with the optical system.
12. An apparatus as claimed in claim 1 , wherein the output of the detector has a signal profile corresponding to a reflection of the probe beam in respect of the location to be measured.
13. An apparatus as claimed in claim 12 , wherein the output of the detector is a trace comprising a number of profiles and/or characteristics respectively corresponding to a number of reflections of the probe beam.
14. An apparatus as claimed in claim 13 , wherein the number of reflections comprises a first reflection from the location to be measured and another location to be measured, the locations to be measured being misaligned with respect to each other.
15. A method of optical measurement, comprising:
generating a probe beam;
directing the probe beam to a location to be measured;
receiving via an optical system having a receiving axis a reflected beam from the location to be measured;
assessing with a processing resource a characteristic of an output signal corresponding to the reflected beam in order to determine the degree of alignment of the location to be measured with the receiving axis of the optical system;
storing reference profile data corresponding to at least part of a profile and/or reference characteristic data relating thereto, the reference profile data and/or the reference characteristic data corresponding to a state of alignment with the optical system; and
the processing resource making the assessment of the degree of alignment based upon comparison of at least part of the signal profile and/or characteristic data relating thereto in respect of the output measured and the stored reference profile data and/or the stored reference characteristic data.
16. An optical measurement apparatus comprising:
an optical system comprising:
a source arranged to generate, when in use, a probe beam, the optical system being arranged to direct, when in use, the probe beam to a location to be measured;
a detector arranged to receive, when in use, a reflected beam from the location to be measured; and
a receiving axis;
wherein the apparatus further comprises:
a processing resource operably coupled to the detector and capable of assessing when in use, a characteristic of an output generated by the detector, the output of the detector having a signal profile corresponding to a reflection of the probe beam in respect of the location to be measured; wherein
the signal profile is generated by acquiring a number of sequential profiles over a period of time using the probe beam and processing a number of output signals corresponding to the sequential profiles; and
assessment of the characteristic of the output corresponds to an assessment of degree of alignment of the location to be measured with the receiving axis of the optical system.
17. An apparatus as claimed in claim 16 , wherein the processing of the number of output signals comprises filtering the number of output signals so as to discard any output signals having respective degrees of alignment that do not conform to a predetermined alignment degree threshold.
18. An apparatus as claimed in claim 16 , wherein the processing of the number of output signals comprises averaging undiscarded output signals from the number of output signals.