Solid-state imaging device, method of manufacturing solid-state imaging device, and electronic apparatus
Provided is a solid-state imaging device including: a first-conductivity-type substrate; a second-conductivity-type well formed in a surface side of the first-conductivity-type substrate; a photoelectric conversion area configured with a first-conductivity-type-impurity area formed in the second-conductivity-type well to convert incident light to charges; a first-conductivity-type-charge retaining area configured with the first-conductivity-type-impurity area formed in the second-conductivity-type well to retain the charges converted by the photoelectric conversion area until the charges are read out; a charge voltage conversion area configured with the first-conductivity-type-impurity area formed in the second-conductivity-type well to convert the charges retained in the charge retaining area to a voltage; and a first-conductivity-type-layer area configured by forming a first-conductivity-type-in a convex shape from a boundary between the first-conductivity-type substrate and the second-conductivity-type well to a predetermined depth of the surface side under at least one portion of the charge retaining area and the charge voltage conversion area.
1. A solid-state imaging device comprising:
a first conductivity type substrate;
a second conductivity type well at a surface side of the first conductivity type substrate;
a photoelectric conversion area in the second conductivity type well to convert incident light to charges;
a first conductivity type charge retaining area in the second conductivity type well to retain the charges output from the photoelectric conversion area until the charges are read out, the first conductivity type charge retaining area being separate from the photoelectric conversion area;
a charge voltage conversion area in the second conductivity type well to convert the charges retained in the charge retaining area to a voltage; and
a first conductivity type layer area that is separate from the photoelectric conversion area and the first conductivity type charge retaining area, the first conductivity type layer area being configured as a first conductivity type region having a convex shape such that the first conductivity type region protrudes from a boundary between the first conductivity type substrate and the second conductivity type well to a predetermined position under at least a portion of the first conductivity type charge retaining area,
wherein,
the first conductivity type layer area is provided as a portion of the first conductivity type substrate that protrudes upwards under at least the portion of the first conductivity type charge retaining area and has a lower concentration of a first conductivity type impurity than the first conductivity type substrate.
2. An electronic apparatus comprising:
a solid-state imaging device, the solid-state imaging device including an array of unit pixels, each unit pixel including:
a first conductivity type substrate,
a second conductivity type well at a surface side of the first conductivity type substrate,
a photoelectric conversion area in the second conductivity type well to convert incident light to charges,
a first conductivity type charge retaining area in the second conductivity type well to retain the charges output from the photoelectric conversion area until the charges are read out, the first conductivity type charge retaining area being separate from the photoelectric conversion area,
a charge voltage conversion area in the second conductivity type well to convert the charges retained in the charge retaining area to a voltage, and
a first conductivity type layer area that is separate from the photoelectric conversion area and the first conductivity type charge retaining area, the first conductivity type layer area being configured as a first conductivity type region having a convex shape such that the first conductivity type region protrudes from a boundary between the first conductivity type substrate and the second conductivity type well to a predetermined position under at least a portion of the first conductivity type charge retaining area,
wherein,
the solid-state device is configured such that charge accumulation is simultaneously performed for all of the unit pixels in the array,
each unit pixel further includes a transfer gate that transfers the charges accumulated in the photoelectric conversion area to the charge retaining area that retains the charges until the charges are read out, and
the first conductivity type layer area in each unit pixel is provided as a portion of the first conductivity type substrate that protrudes upwards under at least the portion of the first conductivity type charge retaining area and has a lower concentration of a first conductivity type impurity than the first conductivity type substrate.
3. A solid-state imaging device comprising:
a first conductivity type substrate;
a second conductivity type well at a surface side of the first conductivity type substrate;
a photoelectric conversion area in the second conductivity type well to convert incident light to charges;
a first conductivity type charge retaining area in the second conductivity type well to retain the charges output from the photoelectric conversion area until the charges are read out, the first conductivity type charge retaining area being separate from the photoelectric conversion area;
a charge voltage conversion area in the second conductivity type well to convert the charges converted by the photoelectric conversion area to a voltage; and
a first conductivity type layer area separate from the photoelectric conversion area and the first conductivity type charge retaining area, the first conductivity type layer area being configured as a first conductivity type region having a convex shape such that the first conductivity type region protrudes from a boundary between the first conductivity type substrate and the second conductivity type well to a predetermined position under at least a portion of the charge voltage conversion area,
wherein,
the first conductivity type layer area is provided as a portion of the first conductivity type substrate that protrudes upwards under at least the portion of the charge voltage conversion area and has a lower concentration of a first conductivity type impurity than the first conductivity type substrate.
4. An electronic apparatus comprising:
a solid-state imaging device, the solid-state imaging device including an array of unit pixels, each pixel including:
a first conductivity type substrate,
a second conductivity type well at a surface side of the first conductivity type substrate,
a photoelectric conversion area in the second conductivity type well to convert incident light to charges,
a first conductivity type charge retaining area in the second conductivity type well to retain the charges output from the photoelectric conversion area until the charges are read out, the first conductivity type charge retaining area being separate from the photoelectric conversion area,
a charge voltage conversion area in the second conductivity type well to convert the charges converted by the photoelectric conversion area to a voltage, and
a first conductivity type layer area separate from the photoelectric conversion area and the first conductivity type charge retaining area, the first conductivity type layer area being configured as a first conductivity type region having a convex shape such that the first conductivity type region protrudes from a boundary between the first conductivity type substrate and the second conductivity type well to a predetermined position under at least a portion of the charge voltage conversion area,
wherein,
the solid-state device is configured such that charge accumulation is simultaneously performed for all of the unit pixels in the array,
each unit pixel further includes a transfer gate that transfers the charges accumulated in the photoelectric conversion area to the charge retaining area that retains the charges until the charges are read out, and
the first conductivity type layer area in each unit pixel is provided as a portion of the first conductivity type substrate that protrudes upwards under at least the portion of the charge voltage conversion area and has a lower concentration of a first conductivity type impurity than the first conductivity type substrate.