IP Library Granted Patent US 8,747,633
Granted Patent B2
US 8,747,633 · App. 13/470,800 · Granted Jun 10, 2014

Tantalum sputtering target and method for manufacturing the same, and method for manufacturing semiconductor element

Inventors: Nobuaki Nakashima (Yokohama, JP); Yoshiki Orimoto (Yokohama, JP)
Assignees: Kabushiki Kaisha Toshiba; Toshiba Materials Co., Ltd.
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Quick Facts
Patent No.
US 8,747,633
App. No.
13/470,800
Granted
Jun 10, 2014
Kind
B2
Abstract

In one embodiment, a method for manufacturing a tantalum sputtering target includes a first knead forging step, a first heating step, a second knead forging step, a cold rolling step, and a second heating step. In the first knead forging step, a tantalum material is subjected to two sets or more of knead forging, each of the sets being cold forging in directions parallel to and perpendicular to a thickness direction. In the second knead forging step, one set or more of knead forging is performed after the first heating step, each of the steps being cold forging in the directions parallel to and perpendicular to the thickness direction.

Claims (10)

1. A tantalum sputtering target having a 99.99 wt % tantalum purity or more and a 50 μm average crystal grain size or less,

wherein the tantalum sputtering target has a surface to be sputtered, and

wherein, when X-ray diffraction (2θ) of the surface of the tantalum sputtering target is measured, peak relative intensities of (110), (211), and (200) planes become smaller in order of (110)>(211)>(200) which is equal to an intensity order of three major peaks in a Powder Diffraction File of tantalum.

2. The tantalum sputtering target according to claim 1 , wherein a thickness is 10 mm or more.

3. The tantalum sputtering target according to claim 1 ,

wherein, when X-ray diffraction (2θ) in a depth direction of the target is measured, peak relative intensities of (110), (211), and (200) planes become smaller in order of (110)>(211)>(200) which is equal to an intensity order of three major peaks in a Powder Diffraction File of tantalum.

4. A method for manufacturing a semiconductor element having a step of sputtering by using a tantalum sputtering target,

wherein the tantalum sputtering target is the tantalum sputtering target according to claim 1 .

5. The method for manufacturing the semiconductor element according to claim 4 ,

wherein the sputtering is performed under a nitrogen-containing atmosphere.

Assignments (4)
NUNC PRO TUNC ASSIGNMENT Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MATERIALS CO. LTD.
Reel/Frame 074940/0511 →
CHANGE OF NAME Recorded Feb 19, 2026
From: TOSHIBA MATERIALS CO. LTD.
To: NITERRA MATERIALS CO., LTD.
Reel/Frame 074941/0803 →
CHANGE OF ADDRESS Recorded Feb 19, 2026
From: KABUSHIKI KAISHA TOSHIBA
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 074941/0846 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2012
From: NAKASHIMA, NOBUAKI; ORIMOTO, YOSHIKI
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MATERIALS CO., LTD.
Reel/Frame 028499/0431 →
Priority Claims (1)
JP P2009-262103 · Nov 17, 2009 · national
Continuity (2)
Continuation PCTJP2010006482 · Nov 4, 2010
Related Publication 20120267236A1 · Oct 25, 2012