IP Library Granted Patent US 8,767,188
Granted Patent B2
US 8,767,188 · App. 13/481,419 · Granted Jul 1, 2014

Measuring device for distance measurement

Inventors: Torsten Gogolla (Schaan, LI); Stefan Tiefenthaler (Meiningen, AT); Roman Steffen (Rebstein, CH); Helmut Seifert (Serba, DE); Gero Schusser (Jena, DE)
Assignees: Hilti Aktiengesellschaft; ESW GmbH
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Quick Facts
Patent No.
US 8,767,188
App. No.
13/481,419
Granted
Jul 1, 2014
Kind
B2
Abstract

A measuring device for measuring a distance between a reference mark and a target object is disclosed. The device includes a beam source, which is embodied as an electro-optical component and emits a laser beam along an optical axis, a detector, which is embodied as an additional electro-optical component and receives a reception beam reflected and/or scattered by the target object along an optical axis, a beam forming optics, which forms the laser beam and the reception beam along an optical axis, and a beam splitting optics, which deflects the laser beam or the reception beam. An optics carrier is provided with a first receptacle for mounting a first of the electro-optical components and a second receptacle for mounting the beam forming optics. The optics carrier is monolithic.

Claims (40)

1. A measuring device for measuring a distance between a reference mark and a target object, comprising:

a beam source, wherein a laser beam is generatable by the beam source;

a detector, wherein a reflected beam of the laser beam is detectable by the detector;

a beam forming optics, wherein the beam forming optics is disposed in a beam path of the laser beam and the reflected beam;

a beam splitting optics, wherein the laser beam or the reflected beam are deflectable by the beam splitting optics; and

an optics carrier including a first receptacle, wherein the beam source is mounted in the first receptacle, and a second receptacle, wherein the beam forming optics are mounted in the second receptacle, and wherein the optics carrier is monolithic;

wherein the beam source and the beam forming optics are only adjustable in a direction of a respective optical axis of the beam source and the beam forming optics; and

wherein the respective optical axes are parallel.

2. The measuring device according to claim 1 , wherein the beam splitting optics includes an opening and a reflective coating, wherein the opening is integrated into the optics carrier, and wherein the reflective coating surrounds the opening.

3. The measuring device according to claim 1 , wherein an aperture is disposed in a beam path of a laser beam generated by the beam source between the beam source and the beam splitting optics and wherein the aperture is integrated into the optics carrier.

4. The measuring device according to claim 1 , wherein a light trap is disposed in a beam path of a laser beam generated by the beam source between the beam source and the beam splitting optics and wherein the light trap is integrated into the optics carrier.

5. The measuring device according to claim 1 , wherein the optics carrier is a metallic material.

6. The measuring device according to claim 1 , wherein the optics carrier is a die-cast part.

7. The measuring device according to claim 1 , wherein the optics carrier is a die-cast part of zinc or a zinc alloy.

8. A measuring device for measuring a distance between a reference mark and a target object, comprising:

a beam source, wherein a laser beam is generatable by the beam source;

a detector, wherein a reflected beam of the laser beam is detectable by the detector;

a beam forming optics, wherein the beam forming optics is disposed in a beam path of the laser beam and the reflected beam;

a beam splitting optics, wherein the laser beam or the reflected beam are deflectable by the beam splitting optics; and

an optics carrier including a first receptacle, wherein the beam source is mounted in the first receptacle, and a second receptacle, wherein the beam forming optics are mounted in the second receptacle, and wherein the optics carrier is monolithic;

wherein the second receptacle has a first supporting surface, a second supporting surface, and a clamping surface for mounting the beam forming optics such that the first and the second supporting surfaces and the clamping surface are integrated into the optics carrier.

9. The measuring device according to claim 8 , wherein the clamping surface is a spring element.

10. The measuring device according to claim 8 , wherein the second receptacle has a guide surface integrated into the optics carrier.

11. A measuring device for measuring a distance between a reference mark and a target object, comprising:

a beam source, wherein a laser beam is generatable by the beam source;

a detector, wherein a reflected beam of the laser beam is detectable by the detector;

a beam forming optics, wherein the beam forming optics is disposed in a beam path of the laser beam and the reflected beam;

a beam splitting optics, wherein the laser beam or the reflected beam are deflectable by the beam splitting optics; and

an optics carrier including a first receptacle, wherein the beam source is mounted in the first receptacle, and a second receptacle, wherein the beam forming optics are mounted in the second receptacle, and wherein the optics carrier is monolithic;

wherein the optics carrier includes a third receptacle with three supporting areas, wherein the three supporting areas are integrated into the optics carrier, and wherein the beam splitting optics is mounted in the third receptacle.

12. The measuring device according to claim 11 , wherein a first supporting area and a second supporting area of the three supporting areas are wedge-shaped grooves, wherein a third supporting area of the three supporting areas is a planar supporting surface, wherein the third receptacle includes a clamping element, and wherein the beam splitting optics is clamped to the third supporting area by the clamping element.

13. A measuring device, comprising:

a beam source;

a beam forming optics;

a beam splitting optics;

a monolithic optics carrier, wherein the beam source, the beam forming optics, and the beam splitting optics are mounted in the monolithic optics carrier;

a detector;

a circuit board, wherein the detector is connected to the circuit board; and

a connector, wherein the circuit board is connected to the monolithic optics carrier via the connector, wherein the beam source and the beam forming optics are only adjustable in a direction of a respective optical axis of the beam source and the beam forming optics; and

wherein the respective optical axes are parallel.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 18, 2020
From: JENOPTIK ADVANCED SYSTEMS GMBH
To: JENOPTIK OPTICAL SYSTEMS GMBH
Reel/Frame 052152/0535 →
CHANGE OF NAME Recorded May 5, 2017
From: ESW GMBH
To: JENOPTIK ADVANCED SYSTEMS GMBH
Reel/Frame 042418/0054 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 7, 2012
From: GOGOLLA, TORSTEN; TIEFENTHALER, STEFAN; STEFFEN, ROMAN; SEIFERT, HELMUT; SCHUSSER, GERO
To: HILTI AKTIENGESELLSCHAFT; ESW GMBH
Reel/Frame 028739/0034 →
Priority Claims (1)
DE 10 2011 076 491 · May 26, 2011 · national
Continuity (1)
Related Publication 20120300190A1 · Nov 29, 2012