IP Library Granted Patent US 8,779,422
Granted Patent B2
US 8,779,422 · App. 13/244,208 · Granted Jul 15, 2014

Semiconductor device with buried bit line and method for fabricating the same

Inventors: Sang-Do Lee (Gyeonggi-do, KR); Kyung-Bo Ko (Gyeonggi-do, KR); Hae-Jung Lee (Gyeonggi-do, KR)
Assignee: SK Hynix Inc.
H01L27/12H01L27/1214H01L29/66757H01L29/78675Y02E10/50
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,779,422
App. No.
13/244,208
Granted
Jul 15, 2014
Kind
B2
Abstract

A semiconductor device includes an active body having two sidewalls facing each other in a lateral direction, a junction formed in a sidewall of the two sidewalls, a dielectric layer having an open portion to expose the junction and covering the active body, a junction extension portion having a buried region to fill the open portion, and a bit line coupled to the junction extension portion.

Claims (15)

1. A semiconductor device comprising:

an active body having two sidewalls facing each other in a lateral direction;

a junction formed in a sidewall of the two sidewalls;

a dielectric layer having an open portion to expose the junction and covering the active body;

a junction extension portion coupled with the junction through the open portion and having a trench therein; and

a bit line formed on the trench of the junction extension portion,

wherein the junction extension portion comprises a polysilicon layer, and the bit line comprises a titanium nitride (TiN) layer.

2. The semiconductor device of claim 1 , wherein the junction extension portion comprises a silicon layer.

3. The semiconductor device of claim 1 , wherein the junction extension portion comprises an impurity-doped polysilicon layer.

4. The semiconductor device of claim 1 , wherein the junction and the junction extension portion have impurities doped therein, the impurities having the same conductive type.

5. The semiconductor device of claim 1 , wherein the bit line comprises a metal layer or a metal nitride layer.

6. The semiconductor device of claim 1 , further comprising:

an active pillar formed over the active body;

a word line formed on sidewalls of the active pillar and extended in a direction crossing the bit line; and

a capacitor coupled to an upper portion of the active pillar.

Assignments (2)
CHANGE OF NAME Recorded Jun 11, 2014
From: HYNIX SEMICONDUCTOR INC.
To: SK HYNIX INC.
Reel/Frame 033125/0619 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 23, 2011
From: LEE, SANG-DO; KO, KYUNG-BO; LEE, HAE-JUNG
To: HYNIX SEMICONDUCTOR INC.
Reel/Frame 026965/0335 →
Priority Claims (1)
KR 10-2011-0066095 · Jul 4, 2011 · national
Continuity (1)
Related Publication 20130009153A1 · Jan 10, 2013