IP Library Granted Patent US 8,798,949
Granted Patent B2
US 8,798,949 · App. 13/109,165 · Granted Aug 5, 2014

Spectrometer, measuring apparatus, and method of data processing

Inventors: Kiyonori Takegoshi (Kyoto, JP); Yusuke Nishiyama (Akishima, JP)
Assignee: JEOL Resonance Inc.
G01R33/4625G01N2201/1245G01N24/08G01R33/5608
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Quick Facts
Patent No.
US 8,798,949
App. No.
13/109,165
Granted
Aug 5, 2014
Kind
B2
Abstract

A spectrometer has: Accumulation means to obtain a data set containing N data points, repeating the measurement M times to obtain M spectral data sets or time-domain data sets S 1 (d 1 to dN) to SM (d 1 to dN), and accumulating the M spectral data sets or time-domain data sets. Means for creating sets S 1 (dn) to SM (dn) of the data points contained in the M spectral data sets or time-domain data sets S 1 (d 1 to dN) to SM (d 1 to dN). Correlation computing means for finding correlations. Computing means for finding either the product of an accumulated or anticipated spectrum.

Claims (14)

1. A measuring apparatus comprising:

means for creating M data sets S 1 (d 1 to dN) to SM (d 1 to dN) by repeating a measurement while varying at least one measurement parameter in M increments, each of the data sets having N data points;

means for creating sets S 1 (dn) to SM (dn) of the data points contained in the M data sets S 1 (d 1 to dN) to SM (d 1 to dN) such that the data points of each one of the sets S 1 (dn) to SM (dn) have the same ordinal number dn;

correlation computing means for finding a correlation data set C(c 1 to cN) indicating correlation strengths about the data points of the ordinal numbers by finding correlations between data representing variations forecasted in response to variations in the parameter regarding the sets S 1 (dn) to SM(dn); and

computing means for finding a product of an accumulated or anticipated data set Sav(d 1 to dN) which has N data points and which is obtained by an accumulation operation after correcting effects of variations in the parameter regarding the data sets S 1 (d 1 to dN) to SM(d 1 to dN) and the correlation data set C(c 1 to cN) or a product of a separately measured data set So(d 1 to dN) and the correlation data set C(c 1 to cN).

2. A measuring apparatus as set forth in claim 1 , wherein said measuring apparatus is an NMR spectrometer, an ESR spectrometer, an electromagnetic spectrometer employing X-rays, ultraviolet rays, visible light, infrared radiation, microwaves, or radio waves, a mass spectrometer, an instrument utilizing a charged-particle beam (including an electron microscope), or an imaging apparatus employing any of such instruments.

3. A measuring apparatus as set forth in claim 2 , wherein said measuring apparatus is an NMR spectrometer, and wherein a combination of the varied parameter and data whose correlations and their strengths should be found is at least one of (1) a combination in which the parameter is the phase of a reference wave for a receiving system for observing an NMR signal or the phase of an excitation RF wave for exciting nuclei under observation and the data whose correlations should be found indicate the phases at data points of an actually measured NMR signal, (2) a combination in which the parameter is the intensity of an excitation RF wave and the data whose correlations should be found indicate the intensities at data points of an actually measured NMR signal, and (3) a combination in which the parameter is a center frequency of an excitation RF wave and the data whose correlations indicate a frequency position at which an actually measured NMR signal appears.

4. A measuring apparatus as set forth in claim 3 , wherein said correlation strength is found relative to data measured concerning a direct observation axis used in one-dimensional NMR measurements or relative to data obtained concerning an indirect observation axis used in multidimensional NMR spectroscopy.

5. A method of processing and displaying data indicative of the molecular structure of a specimen, comprising the steps of:

performing a NMR measurement using at least one measurement parameter to obtain a data set containing N data points;

repeating the measurement while varying the parameter in M increments to obtain M data sets S 1 (d 1 to dN) to SM (d 1 to dN);

creating sets S 1 (dn) to SM (dn) of the data points contained in the M spectral data sets S 1 (d 1 to dN) to SM (d 1 to dN) such that the data points of each one of the sets S 1 (dn) to SM (dn) have the same ordinal number dn;

finding, with a computer, corrections between data representing variations forecasted in response to variations in the parameter regarding the sets S 1 (dn) to SM (dn) to thereby find a correlation data set C (c 1 to cN) indicating correlation strengths about the data points of the ordinal numbers; and

finding and displaying, with a computer, a product of an accumulated or anticipated data set Say (d 1 to dN) which has N data points and which is obtained by an accumulation operation after correcting effects of variations in the parameter and the correlation data set C (c 1 to cN) regarding the data sets S 1 (d 1 to dN) to SM (d 1 to dN) or a product of a separately measured data set So (d 1 to dN) and the correlation data set C (c 1 to cN).

Assignments (2)
MERGER Recorded Jan 13, 2023
From: JEOL RESONANCE INC.
To: JEOL LTD.
Reel/Frame 062386/0312 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 1, 2011
From: TAKEGOSHI, KIYONORI; NISHIYAMA, YUSUKE
To: JEOL RESONANCE INC.
Reel/Frame 026678/0220 →
Priority Claims (1)
JP 2010-115597 · May 19, 2010 · national
Continuity (1)
Related Publication 20110288802A1 · Nov 24, 2011