Semiconductor device, measurement apparatus, and measurement method of relative permittivity
View Patent ↗The field of an oxide semiconductor has been attracted attention in recent years. Therefore, the correlation between electric characteristics of a transistor including an oxide semiconductor layer and physical properties of the oxide semiconductor layer has not been clear yet. Thus, a first object is to improve electric characteristics of the transistor by control of physical properties of the oxide semiconductor layer. A semiconductor device including at least a gate electrode, an oxide semiconductor layer, and a gate insulating layer sandwiched between the gate electrode and the oxide semiconductor layer, where the oxide semiconductor layer has the relative permittivity of equal to or higher than 13 (or equal to or higher than 14), is provided.
1. A semiconductor device comprising:
a gate electrode;
an oxide semiconductor layer; and
a gate insulating layer between the gate electrode and the oxide semiconductor layer,
wherein the gate electrode is provided over the oxide semiconductor layer, and
wherein a relative permittivity of the oxide semiconductor layer is equal to or higher than 13.
2. A semiconductor device comprising:
a gate electrode;
an oxide semiconductor layer; and
a gate insulating layer between the gate electrode and the oxide semiconductor layer,
wherein the gate electrode is provided over the oxide semiconductor layer, and
wherein a relative permittivity of the oxide semiconductor layer is equal to or higher than 14.
3. The semiconductor device according to claim 1 or 2 , wherein the oxide semiconductor layer contains indium, gallium, zinc, and oxygen as a main component.
4. The semiconductor device according to claim 1 or 2 , wherein the relative permittivity of the oxide semiconductor layer is equal to or lower than 70.
5. The semiconductor device according to claim 1 or 2 , further comprising a channel protective layer over the oxide semiconductor layer.