IP Library Granted Patent US 8,860,163
Granted Patent B2
US 8,860,163 · App. 13/324,973 · Granted Oct 14, 2014

Optical structure of semiconductor photomultiplier and fabrication method thereof

Inventors: Joon Sung Lee (Daejeon, KR); Yong Sun Yoon (Daejeon, KR)
Assignee: Electronics and Telecommunications Research Institute
H01L31/02327G01T1/248G01J1/0214G01T1/2002G01J1/0407H01L27/14627
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Quick Facts
Patent No.
US 8,860,163
App. No.
13/324,973
Granted
Oct 14, 2014
Kind
B2
Abstract

Disclosed is an optical structure formed in an upper side of a semiconductor photomultiplier having a plurality of microcells. The optical structure includes: a first dielectric body formed in an upper side of a dead area between light receiving areas of the respective microcells and having a cross-sectional structure in which a lower side is wider than an upper side; and a second dielectric body formed in the upper side of the light receiving area of each microcell and having a cross-sectional structure in which a lower side is narrower than an upper side, and a refractive index of the second dielectric body is higher than that of the first dielectric body.

Claims (12)

1. An optical structure of a semiconductor photomultiplier, which is formed over an upper side of the semiconductor photomultiplier having a plurality of microcells, the optical structure comprising:

a first dielectric body formed in a dead area between light receiving areas of the respective microcells and over an upper surface of a substrate in the dead area, the first dielectric body having a cross-section in which a lower side is wider than an upper side;

a second dielectric body formed in the a light receiving area of a microcell and over an upper surface of the substrate in the light receiving area, the second dielectric body having a cross-section in which a lower side is narrower than an upper side; and

an etch stop layer disposed between the upper surface of the substrate and the first and second dielectric bodies, the etch stop layer including a different material from the first dielectric layer,

wherein a refractive index of the second dielectric body is higher than that of the first dielectric body.

2. The optical structure of a semiconductor photomultiplier of claim 1 , wherein the first dielectric body has a concave triangular, a trapezoidal, a triangular, a semicircular, or a parabolic structure.

3. The optical structure of a semiconductor photomultiplier of claim 1 , wherein top surfaces of the first dielectric body and the second dielectric body are coplanar.

4. The optical structure of a semiconductor photomultiplier of claim 1 , wherein the first dielectric body includes silicon oxide, the second dielectric body includes silicon nitride, and the etch stop layer is a silicon nitride layer.

5. The optical structure of a semiconductor photomultiplier of claim 1 , wherein the first dielectric body includes porous silicon oxide, the second dielectric body includes high density silicon oxide, and the etch stop layer is a silicon nitride layer.

6. The optical structure of a semiconductor photomultiplier of claim 1 , wherein the first dielectric body includes air.

7. The optical structure of a semiconductor photomultiplier of claim 3 , wherein a side surface of the first dielectric body extends to the etch stop layer and abuts a side surface of the second dielectric body so that the cross-section of the second dielectric body is defined by the first dielectric body and the etch stop layer.

8. The optical structure of a semiconductor photomultiplier of claim 1 , wherein a refractive index of the second dielectric body 1.4 or more and a refractive index of the first dielectric body is 1.1 or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2011
From: LEE, JOON SUNG; YOON, YONG SUN
To: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Reel/Frame 027387/0845 →
Priority Claims (1)
KR 10-2010-0129841 · Dec 17, 2010 · national
Continuity (1)
Related Publication 20120153420A1 · Jun 21, 2012