IP Library › Granted Patent US 8,866,236
Granted Patent B2
US 8,866,236 · App. 12/769,993 · Granted Oct 21, 2014

Package structure having MEMS element

Inventors: Chi-Hsin Chiu (Taichung, TW); Chih-Ming Huang (Taichung, TW); Chang-Yueh Chan (Taichung, TW); Hsin-Yi Liao (Taichung, TW); Chun-Chi Ke (Taichung, TW)
Assignee: Siliconware Precision Industries Co., Ltd.
H01L21/56H01L23/315H01L2924/01046H01L2224/48465B81B2207/095H01L24/48H01L2924/09701B81B7/007H01L2924/3025H01L2924/01079H01L2924/01013H01L2224/48227H01L23/552H01L2924/01029
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Quick Facts
Patent No.
US 8,866,236
App. No.
12/769,993
Granted
Oct 21, 2014
Kind
B2
Abstract

A package structure having at least an MEMS element is provided, including a chip having electrical connecting pads and the MEMS element; a lid disposed on the chip to cover the MEMS element and having a metal layer provided thereon; first sub-bonding wires electrically connecting to the electrical connecting pads; second sub-bonding wires electrically connecting to the metal layer; an encapsulant disposed on the chip, wherein the top ends of the first and second sub-bonding wires are exposed from the encapsulant; and metallic traces disposed on the encapsulant and electrically connecting to the first sub-bonding wires. The package structure advantageously features reduced size, relatively low costs, diverse bump locations, and an enhanced EMI shielding effect.

Claims (28)

1. A package structure having at least a Micro Electro Mechanical System (MEMS) element, comprising:

a chip provided thereon with a plurality of electrical connection pads and the at least an MEMS element;

a lid disposed on the chip to cover the MEMS element;

a metal layer only disposed on a top surface of the lid and in direct physical contact with the lid;

a plurality of first sub-bonding wires electrically connecting to the electrical connection pads, respectively;

a plurality of second sub-bonding wires electrically connecting to the metal layer;

an encapsulant disposed on the chip to cover the lid, the first sub-bonding wires and the second sub-bonding wires, wherein top ends of the first sub-bonding wires and the second sub-bonding wires are exposed from a top surface of the encapsulant; and

a plurality of metallic traces disposed on the encapsulant and electrically connected to the first sub-bonding wires.

2. The structure of claim 1 , further comprising a first insulation layer provided on the encapsulant and the metallic traces and having a plurality of openings for exposing the metallic traces.

3. The structure of claim 1 , further comprising a second insulation layer provided on the encapsulant and having a plurality of openings for exposing the first sub-bonding wires such that the metallic traces are provided in the openings and on the second insulation layer.

4. The structure of claim 1 , wherein the electrical connection pads are disposed at an outer periphery of the lid.

5. The structure of claim 1 , wherein each of the metallic traces has an end extending towards the MEMS element and having a bump provided thereon.

6. The structure of claim 1 , wherein the metal layer is composed of a plurality of bonding pads.

7. The structure of claim 1 , wherein the metallic traces further electrically connect to the second sub-bonding wires.

8. The structure of claim 1 , wherein the metallic traces are electrically isolated from the second sub-bonding wires.

9. A package structure having at least a Micro Electro Mechanical System (MEMS) element, comprising:

a chip provided thereon with a plurality of electrical connection pads and the at least an MEMS element;

a lid disposed on the chip to cover the MEMS element;

a metal layer only disposed on a top surface the lid and in direct physical contact with the lid;

a plurality of first sub-bonding wires electrically connecting to the electrical connection pads, respectively;

a plurality of second sub-bonding wires electrically connecting to the metal layer;

an encapsulant disposed on the chip to cover the lid, the first sub-bonding wires and the second sub-bonding wires, wherein top ends of the first sub-bonding wires and the second sub-bonding wires are exposed from a top surface of the encapsulant; and

a plurality of metallic traces disposed on the encapsulant and electrically connected to the second sub-bonding wires.

10. The structure of claim 9 , further comprising a first insulation layer provided on the encapsulant and the metallic traces and having a plurality of openings for exposing the metallic traces.

11. The structure of claim 9 , further comprising a second insulation layer provided on the encapsulant and having a plurality of openings for exposing the second sub-bonding wires such that the metallic traces are provided in the openings and on the second insulation layer.

12. The structure of claim 9 , wherein the electrical connection pads are disposed at an outer periphery of the lid.

13. The structure of claim 9 , wherein each of the metallic traces has an end extending towards the MEMS element and having a bump provided thereon.

14. The structure of claim 9 , wherein the metallic traces are electrically isolated from the first sub-bonding wires.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2010
From: CHIU, CHI-HSIN; HUANG, CHIH-MING; CHAN, CHANG-YUEH; LIAO, HSIN-YI; KE, CHUN-CHI
To: SILICONWARE PRECISION INDUSTRIES CO., LTD.
Reel/Frame 024309/0893 →
Priority Claims (1)
TW 99101443 A · Jan 20, 2010 · national
Continuity (1)
Related Publication 20110175179A1 · Jul 21, 2011