IP Library Granted Patent US 8,901,512
Granted Patent B2
US 8,901,512 · App. 14/239,900 · Granted Dec 2, 2014

Particle detector

Inventors: Hideaki Fujita (Osaka, JP); Haruki Kamiyama (Osaka, JP); Kazushi Fujioka (Osaka, JP); Hiroki Okuno (Osaka, JP)
Assignee: Sharp Kabushiki Kaisha
G01N21/6486G01N21/645G01N2021/6463G01N2021/6421
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Quick Facts
Patent No.
US 8,901,512
App. No.
14/239,900
Granted
Dec 2, 2014
Kind
B2
Abstract

There is provided a particle detector that can increase a detection sensitivity to fluorescence emitted from biogenic particles. A particle detector for detecting biogenic particles includes a substrate having a principal surface and configured to collect the biogenic particles on the principal surface, a light emitting element configured to irradiate particles collected on the principal surface with excitation light, and a light receiving element configured to receive fluorescence emitted from the particles when the particles are irradiated with the excitation light from the light emitting element. An optical axis of the Fresnel lens and a ray direction of the excitation light intersect with each other. The principal surface is a mirror surface.

Claims (8)

1. A particle detector that detects biogenic particles, comprising:

a collecting member having a principal surface and configured to collect the biogenic particles on the principal surface;

a light irradiation unit configured to irradiate the particles collected on the principal surface with excitation light emitted from the light irradiation unit in a direction which defines an acute angle relative to the principal surface; and

a light receiving unit configured to receive fluorescence emitted from the particles when the particles are irradiated with the excitation light from the light irradiation unit,

wherein an optical axis of the light receiving unit and a ray direction of the excitation light intersect with each other,

wherein the principal surface is a mirror surface,

wherein the light irradiation unit includes an edge-emitting semiconductor laser element, and

wherein the semiconductor laser element has a multilayer structure including a light emitting layer, and is disposed such that a stacking direction of the multilayer structure is parallel to the principal surface.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2017
From: SHARP KABUSHIKI KAISHA
To: SHARP LIFE SCIENCE CORPORATION
Reel/Frame 043100/0818 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 21, 2014
From: FUJITA, HIDEAKI; KAMIYAMA, HARUKI; FUJIOKA, KAZUSHI; OKUNO, HIROKI
To: SHARP KABUSHIKI KAISHA
Reel/Frame 032269/0061 →
Priority Claims (1)
JP 2011-197196 · Sep 9, 2011 · national
Continuity (1)
Related Publication 20140166903A1 · Jun 19, 2014