IP Library Granted Patent US 8,912,094
Granted Patent B2
US 8,912,094 · App. 13/846,437 · Granted Dec 16, 2014

Method for manufacturing stretchable thin film transistor

Inventors: Jae Bon Koo (Daejeon, KR); Chan Woo Park (Daejeon, KR); Soon-Won Jung (Daejeon, KR); Sang Chul Lim (Daejeon, KR); Ji-Young Oh (Daejeon, KR); Bock Soon Na (Daejeon, KR); Hye Yong Chu (Daejeon, KR)
Assignee: Electronics and Telecommunications Research Institute
H01L21/76838
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,912,094
App. No.
13/846,437
Granted
Dec 16, 2014
Kind
B2
Abstract

Provided is a method for manufacturing a stretchable thin film transistor. The method for manufacturing a stretchable thin film transistor includes forming a mold substrate, forming a stretchable insulator on the mold substrate, forming a flat substrate on the stretchable insulator, removing the mold substrate, forming discontinuous and corrugated wires on the stretchable insulator, forming a thin film transistor connected between the wires, and removing the flat substrate.

Claims (33)

1. A method for manufacturing a stretchable thin film transistor, the method comprising:

forming a mold substrate;

forming a stretchable insulator on the mold substrate;

forming a flat substrate on the stretchable insulator;

removing the mold substrate;

forming corrugated wires on the stretchable insulator;

forming a thin film transistor connected between the corrugated wires; and

removing the flat substrate,

wherein forming the corrugated wires comprises:

forming discontinuous wires on the stretchable insulator;

thermally expanding the discontinuous wires and the stretchable insulator, a thermal expansion coefficient of the stretchable insulator being greater than a thermal expansion coefficient of the discontinuous wires; and

quenching the thermally expanded wires and the thermally expanded discontinuous stretchable insulator to form the corrugated wires.

2. The method of claim 1 , wherein the mold substrate comprises a bottom substrate and photoresist patterns on the bottom substrate.

3. The method of claim 2 , wherein the bottom substrate contacts a device area on the stretchable insulator, and

the photoresist patterns contact a wire area on the stretchable insulator.

4. The method of claim 3 , wherein the device area of the stretchable insulator is thicker than that of the wire area.

5. The method of claim 1 , wherein thermally expanding the discontinuous wires and the stretchable insulator is performed at a temperature in a range of about 100° C. to about 300° C.

6. The method of claim 1 , further comprising forming an interconnection wire connecting the thin film transistor to the corrugated wires.

7. The method of claim 6 , wherein the interconnection wire is formed by using a printing method.

8. The method of claim 1 , wherein the stretchable insulator comprises poly-dimethyllesiloxane (PDMS).

9. A method for manufacturing a stretchable thin film transistor, the method comprising:

forming a stretchable insulator on a substrate;

forming corrugated wires on the stretchable insulator;

forming a thin film transistor connected to the corrugated wires; and

removing the substrate,

wherein forming the corrugated wires comprises:

forming discontinuous wires on the stretchable insulator;

thermally expanding the discontinuous wires and the stretchable insulator, a thermal expansion coefficient of the stretchable insulator being greater than a thermal expansion coefficient of the discontinuous wires; and

quenching the thermally expanded wires and the thermally expanded discontinuous stretchable insulator to form the corrugated wires.

10. The method of claim 9 , further comprises forming an interconnection wire connecting the thin film transistor to the corrugated wires.

11. The method of claim 10 , wherein the interconnection wire is formed by using a printing method.

12. The method of claim 1 , wherein the thermal expansion coefficient of the stretchable insulator is equal to or greater than 20times of the thermal expansion coefficient of the discontinuous wires.

13. The method of claim 9 , wherein the thermal expansion coefficient of the stretchable insulator is equal to or greater than 20times of the thermal expansion coefficient of the discontinuous wires.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 21, 2013
From: KOO, JAE BON; JUNG, SOON-WON; LIM, SANG CHUL; OH, JI-YOUNG; NA, BOCK SOON; CHU, HYE YONG; PARK, CHAN WOO
To: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Reel/Frame 030064/0624 →
Priority Claims (1)
KR 10-2012-0127615 · Nov 12, 2012 · national
Continuity (1)
Related Publication 20140134840A1 · May 15, 2014