On-chip comparison and response collection tools and techniques
Disclosed herein are exemplary embodiments of a so-called “X-press” test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000×. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.
1. A method, comprising:
using feedback-free compactors, compacting groups of test responses output from corresponding groups of scan chains and thereby generating compacted test responses, each of the compacted test responses being associated with a respective one of the groups of scan chains;
at a first input, receiving masking data for controlling a masking circuit;
at a second input, receiving expected test response data for evaluating the compacted test responses, the masking data and the expected test response data being received simultaneously at the first and second inputs; and
generating one or more error vectors based at least in part on the compacted test responses and the expected test response data.
2. The method of claim 1 , further comprising:
generating information about two or more failing test responses, the information including one or more of a test pattern number and a test cycle number.
3. The method of claim 1 , wherein the error vectors are generated on a shift-cycle-by-shift-cycle basis.
4. The method of claim 1 , wherein each bit of a respective one of the error vectors corresponds to a respective one of the groups of scan chains.
5. A method, comprising:
compacting groups of test responses output from corresponding groups of scan chains and thereby generating compacted test responses, each of the compacted test responses being associated with a respective one of the groups of scan chains;
at a first input, receiving masking data for controlling a masking circuit;
at a second input, receiving expected test response data for evaluating the compacted test responses, the masking data and the expected test response data being received simultaneously at the first and second inputs;
generating one or more error vectors based at least in part on the compacted test responses and the expected test response data;
loading the one or more error vectors into a multiple-input shift register (MISR);
producing one or more compactor signatures in the MISR; and
storing the one or more compactor signatures in one or more computer-readable media.
6. The method of claim 5 , further comprising:
generating a list of candidate fault locations according to the one or more compactor signatures; and
storing the list of candidate fault locations on one or more computer-readable media.
7. A method, comprising:
compacting groups of test responses output from corresponding groups of scan chains and thereby generating compacted test responses, each of the compacted test responses being associated with a respective one of the groups of scan chains;
at a first input, receiving masking data for controlling a masking circuit;
at a second input, receiving expected test response data for evaluating the compacted test responses, the masking data and the expected test response data being received simultaneously at the first and second inputs;
generating one or more error vectors based at least in part on the compacted test responses and the expected test response data;
compacting the error vectors in a priority encoder to produce one or more encoded vectors; and
storing the one or more encoded vectors in one or more computer-readable media.
8. The method of claim 7 , wherein the priority encoder produces an encoded vector from multiple error vectors input into the encoder over a plurality of shift cycles.
9. The method of claim 8 , wherein the priority encoder produces one encoded vector per test pattern.
10. A system, comprising:
means for compacting groups of test responses output from corresponding groups of scan chains;
means for receiving masking data for controlling a masking circuit;
means for receiving expected compacted test response data, the masking data and the expected compacted test response data being received simultaneously;
means for generating one or more error vectors based at least in part on the compacted test responses and the expected compacted test response data;
means for compressing the one or more error vectors to produce one or more encoded vectors; and
means for storing the one or more encoded vectors.