Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and thermal transition temperatures of materials.
1. A device for characterizing a region of a sample with sub-micron spatial resolution, the device comprising:
a self-heating cantilever probe having a tip;
a magnetic source placed in proximity to the cantilever probe; and
a current source in communication with the self-heating cantilever.
2. The device of claim 1 , further comprising a deflection measurement system and a demodulator.
3. The device of claim 1 , wherein the magnetic source comprises a permanent magnet coupled to a magnetic pole piece.
4. The device of claim 3 , wherein the magnetic pole piece has a permeability of more than 10,000.
5. The device of claim 3 , wherein the magnetic source and the magnetic pole piece generate a magnetic field having a strength of at least 0.2 T at the self-heating cantilever probe.
6. The device of claim 1 , wherein the magnetic source comprises a magnet and wherein the magnet is positioned on or in a slot, thereby permitting sliding the magnet between at least two locations.
7. The device of claim 6 , wherein the at least two locations include (a) a first location to maximize a magnetic field at the self-heating cantilever probe and (b) a second location to permit exchanging or removal of the self-heating cantilever probe.
8. The device of claim 1 , wherein the current source is configured to ramp the self-heating cantilever probe through a plurality of temperatures.
9. The device of claim 1 , wherein the current source is configured to include an AC current component that generates an oscillating force on the self-heating cantilever probe.
10. The device of claim 9 , wherein the current source is configured to generate AC currents over a plurality of frequencies.
11. The device of claim 2 , further comprising a resonance tracker to determine a resonance of the self-heating cantilever probe.
12. The device of claim 11 , further comprising a system for calculating one or more viscoelastic properties of a sample based on a resonance of the self-heating cantilever probe.
13. The device of claim 10 , wherein AC currents generated at a plurality of frequencies are used to create a spectrum of the self-heating cantilever probe response versus frequency.
14. The device of claim 13 , where the spectrum of the self-heating cantilever probe response versus frequency is substantially devoid of parasitic mechanical resonances.
15. The device of claim 9 , wherein the AC current comprises an AC frequency component in excess of 1 GHz.
16. The device of claim 15 , wherein the self-heating cantilever probe exerts a force on a sample at a frequency in excess of 1 GHz.
17. The device of claim 3 , further comprising a system for calculation of a plastic deformation property of a region of a sample based on a resonance of the self-heating cantilever probe.
18. The device of claim 17 , wherein the plastic deformation property comprises one or more of a yield strength of the sample, a hardness of the sample and a creep of the sample.
19. The device of claim 3 , further comprising a system for calculation of one or more glass transition temperature properties of a region of a sample based on a resonance of the self-heating cantilever probe.
20. A method of determining a material property of a sub-micron region of a sample, the method comprising the steps of:
interacting a probe tip of a self-heating cantilever probe with a surface of the sample;
applying a force between the probe tip and the surface of the sample, wherein the force is generated by an interaction between a current through the self-heating cantilever probe and a magnetic field;
measuring a response of the self-heating cantilever probe to the applied force; and
determining the property of a sub-micron region of the sample from the measured response.
21. The method of claim 20 , wherein the material property comprises one or more of a plastic deformation property, a yield strength, a hardness, a creep, a glass transition temperature, a melting temperature, a viscoelastic property and a stiffness.
22. The method of claim 20 , further comprising a step of heating at least the sub-micron region of the sample by passing a current through the self-heating cantilever probe.
23. The method of claim 22 , wherein the step of heating at least the sub-micron region of the sample occurs during the step of applying a force between the probe tip and the surface of the sample.
24. The method of claim 22 , further comprising repeating the interacting, applying, measuring and heating steps one or more times to measure a response of the self-heating cantilever probe at a plurality of temperatures of the sub-micron region of the sample.
25. The method of claim 20 , wherein the response of the self-heating cantilever probe comprises one or more of a cantilever deflection, a contact resonance frequency, an amplitude, a phase, an in-phase amplitude (X), and a quadrature amplitude (Y).
26. The method of claim 20 , further comprising repeating the interacting, applying and measuring steps at a plurality of locations of the surface of the sample.