Patent Assignment
Reel/Frame 046942/0185
Assignment of Assignor's Interest
Recorded: 2018-09-21
Pages: 8
Assignor
ANASYS INSTRUMENTS CORP.
Executed: 2018-08-29
Assignee
BRUKER NANO, INC.
112 ROBIN HILL ROAD, SANTA BARBARA, CALIFORNIA, 93117
Covered Properties
(23)
Method and Apparatus Foe Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy
PCT:
PCT/US2017/057171 ↗
Probe with Embedded Heater for Nanoscale Analysis
High Frequency Deflection Measurement of Ir Absorption
Infrared Imaging Using Thermal Radiation from a Scanning Probe Tip
Transition Temperature Microscopy
High Frequency Deflection Measurement of Ir Absorption
Microcantilever with Reduced Second Harmonic While in Contact with a Surface and Nano Scale Infrared Spectrometer
Dynamic Power Control for Nanoscale Spectroscopy
Dynamic Power Control, Beam Alignment and Focus for Nanoscale Spectroscopy
High Frequency Deflection Measurement of Ir Absorption
High Frequency Deflection Measurement of IR Absorption with a Modulated IR Source
High Frequency Deflection Measurement of Ir Absorption
Magnetic Actuation and Thermal Cantilevers for Temperature and Frequency Dependent Atomic Force Microscopy
High Frequency Deflection Measurement of Ir Absorption
Multiple Modulation Heterodyne Infrared Spectroscopy
Stimulated Raman Nanospectroscopy
Patent:
9,046,492 →
Application:
13/668,250 →
Magnetic Actuation and Thermal Cantilevers for Temperature and Frequency Dependent Atomic Force Microscopy
Method and Apparatus for Infrared Scattering Scanning Near-Field Optical Microscopy
Patent:
8,793,811 →
Application:
13/835,312 →
Method and Apparatus for Infrared Scattering Scanning Near-field Optical Microscopy
Method and Apparatus for Infrared Scattering Scanning Near-Field Optical Microscopy with High Speed Point Spectroscopy
Method and Apparatus for Infrared Scattering Scanning Near-Field Optical Microscopy with Background Suppression
Method and Apparatus for Resolution and Sensitivity Enhanced Atomic Force Microscope Based Infrared Spectroscopy
Method and Apparatus for Infrared Scattering Scanning Near-field Optical Microscopy with High Speed Point Spectroscopy
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 17, 2006
From: KING, WILLIAM; READING, MICHAEL
To: ANASYS INSTRUMENTS CORPORATION
Reel/Frame 018108/0514 →
Assignment of Assignor's Interest
Dec 23, 2008
From: RASCHKE, MARKUS B,
To: ANASYS INSTRUMENTS
Reel/Frame 022058/0929 →
Assignment of Assignor's Interest
Mar 1, 2010
From: KING, WILLIAM P.; FELTS, JONATHAN R.
To: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Reel/Frame 024009/0169 →
Assignment of Assignor's Interest
Mar 1, 2010
From: PRATER, CRAIG; KJOLLER, KEVIN
To: ANASYS INSTRUMENTS
Reel/Frame 024009/0282 →
Assignment of Assignor's Interest
Apr 7, 2010
From: READING, MICHAEL; KJOLLER, KEVIN
To: ANASYS INSTRUMENTS CORP.
Reel/Frame 024196/0360 →
Assignment of Assignor's Interest
May 7, 2010
From: PRATER, CRAIG; KJOLLER, KEVIN
To: ANASYS INSTRUMENTS CORP.
Reel/Frame 024384/0527 →
Assignment of Assignor's Interest
Jul 12, 2010
From: VODOPYANOV, KONSTANTIN
To: ANASYS INSTRUMENTS CORP.
Reel/Frame 024680/0960 →
Assignment of Assignor's Interest
Oct 4, 2010
From: READING, MICHAEL
To: ANASYS INSTRUMENTS CORP
Reel/Frame 025104/0408 →
Assignment of Assignor's Interest
Nov 9, 2010
From: PRATER, CRAIG; KJOLLER, KEVIN; LO, MICHAEL; KURTZ, ANTHONY
To: ANASYS INSTRUMENTS, INC.
Reel/Frame 025308/0054 →
Assignment of Assignor's Interest
Dec 28, 2011
From: PRATER, CRAIG; KJOLLER, KEVIN
To: ANASYS INSTRUMENTS CORP
Reel/Frame 027453/0561 →
Assignment of Assignor's Interest
Feb 15, 2012
From: KING, WILLIAM P.; LEE, BYEONGHEE
To: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Reel/Frame 027707/0312 →
Confirmatory License
Jul 16, 2012
From: ILLINOIS URBANA-CHAMPAIGN, UNIVERSITY OF
To: AIR FORCE, UNITED STATES
Reel/Frame 028604/0045 →
Assignment of Assignor's Interest
Apr 15, 2013
From: READING, MICHAEL; KJOLLER, KEVIN
To: ANASYS INSTRUMENTS CORP
Reel/Frame 030217/0953 →
Assignment of Assignor's Interest
Jul 15, 2013
From: PRATER, CRAIG
To: ANASYS INSTRUMENTS
Reel/Frame 030800/0279 →
Assignment of Assignor's Interest
Jul 23, 2013
From: PRATER, CRAIG
To: ANASYS INSTRUMENTS
Reel/Frame 030859/0590 →
Assignment of Assignor's Interest
Jul 23, 2013
From: KING, WILLIAM P.; LEE, BYEONGHEE
To: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
Reel/Frame 030859/0677 →
Assignment of Assignor's Interest
Sep 12, 2013
From: PRATER, CRAIG; RASCHKE, MARKUS B.; BERWEGER, SAM
To: ANASYS INSTRUMENTS
Reel/Frame 031195/0316 →
Assignment of Assignor's Interest
Jul 22, 2014
From: GOTTHARD, DOUG
To: ANASYS INSTRUMENTS
Reel/Frame 033362/0784 →
Confirmatory License
Oct 7, 2015
From: ANASYS INSTRUMENTS
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 036816/0890 →
Confirmatory License
Oct 7, 2015
From: ANASYS INSTRUMENTS
To: ENERGY, UNITED STATES DEPARTMENT OF
Reel/Frame 036815/0403 →
Assignment of Assignor's Interest
May 18, 2016
From: PRATER, CRAIG; KJOLLER, KEVIN; RASCHKE, MARKUS; BELKIN, MIKHAIL
To: ANASYS INSTRUMENTS; BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM; THE TEXAS A&M UNIVERSITY SYSTEM
Reel/Frame 038638/0585 →
Assignment of Assignor's Interest
Feb 7, 2018
From: KJOLLER, KEVIN; PRATER, CRAIG; READING, MICHAEL
To: ANASYS INSTRUMENTS CORP
Reel/Frame 044853/0168 →
Assignment of Assignor's Interest
Feb 7, 2018
From: PRATER, CRAIG
To: ANASYS INSTRUMENTS CORP
Reel/Frame 044860/0484 →
Assignment of Assignor's Interest
Feb 7, 2018
From: PRATER, CRAIG; KJOLLER, KEVIN
To: ANASYS INSTRUMENTS CORP
Reel/Frame 044853/0415 →
Assignment of Assignor's Interest
Feb 7, 2018
From: KJOLLER, KEVIN; PRATER, CRAIG; READING, MICHAEL; VODOPYANOV, KONSTANTIN
To: ANASYS INSTRUMENTS CORP
Reel/Frame 044853/0324 →