IP Library › Granted Patent US 8,916,850
Granted Patent B2
US 8,916,850 · App. 13/878,251 · Granted Dec 23, 2014

Light-emitting element and method for manufacturing same

Inventors: Gyuchul Yi (Seoul, KR); Chulho Lee (Seoul, KR); Yongjin Kim (Seoul, KR)
Assignee: SNU R&DB Foundation
H01L33/34H01L33/24H01L33/641H01L33/18H01L33/04H01L33/0079B82Y20/00H01L33/005H01L33/16H01L33/08
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Quick Facts
Patent No.
US 8,916,850
App. No.
13/878,251
Granted
Dec 23, 2014
Kind
B2
Abstract

The present invention provides a light-emitting element comprising: a carbon layer comprising a graphene; a plurality of fine structures having grown toward the upper side of the carbon layer; and a light-emitting structure layer formed on the surface of the fine structures.

Claims (40)

1. A light-emitting element, comprising:

a carbon layer including graphene;

a plurality of microstructures grown upward from the carbon layer;

a light-emitting structure layer formed on surfaces of the microstructures;

a first electrode layer formed on the light-emitting structure layer; and

an insulating layer disposed between the first electrode layer and the carbon layer,

wherein the light-emitting structure layer is disposed on the insulating layer not to be in contact with the carbon layer.

2. The light-emitting element of claim 1 , further comprising:

a substrate disposed below the carbon layer.

3. The light-emitting element of claim 2 , wherein the carbon layer and the substrate are separable.

4. The light-emitting element of claim 1 , wherein the microstructures are grown upward from damages formed in the carbon layer.

5. The light-emitting element of claim 1 , further comprising:

a second electrode layer formed on a surface of the carbon layer.

6. The light-emitting element of claim 1 , wherein the microstructures comprise a structure selected from the group consisting of a micro-bar, a micro-needle, a micro-tube, and a micro-wall.

7. The light-emitting element of claim 1 , wherein the light-emitting structure layer comprises an n-type semiconductor layer, a p-type semiconductor layer, and a quantum active layer disposed between the n-type semiconductor layer and the p-type semiconductor layer.

8. The light-emitting element of claim 7 , wherein the n-type semiconductor layer comprises gallium nitride, aluminum nitride, gallium aluminum nitride, or indium gallium nitride doped with one or more impurities selected from the group consisting of silicon, germanium, selenium, tellurium, and carbon, and

the p-type semiconductor layer comprises gallium nitride, aluminum nitride, gallium aluminum nitride, or indium gallium nitride doped with one or more impurities selected from the group consisting of magnesium, zinc, and beryllium.

9. The light-emitting element of claim 1 , wherein the microstructures comprise one or more elements selected from the group consisting of zinc oxide, zinc-magnesium oxide, zinc-cadmium oxide, zinc-magnesium-cadmium oxide, zinc-beryllium oxide, zinc-magnesium-beryllium oxide, zinc-manganese oxide, zinc-magnesium-manganese oxide, gallium nitride, aluminum nitride, gallium aluminum nitride, and indium gallium nitride.

10. A method of manufacturing a light-emitting element, comprising:

providing a carbon layer including graphene;

growing a plurality of microstructures upward on the carbon layer; and

forming a light-emitting structure layer on surfaces of the microstructures,

wherein the growing of the microstructures comprises:

generating damages on the carbon layer; and

growing the microstructures upward from the damages,

wherein the generating of the damages comprises:

forming a mask layer on the carbon layer;

forming a plurality of openings by patterning the mask layer; and

forming damages in the carbon layer through the openings.

11. The method of claim 10 , further comprising:

forming a first electrode layer on the light-emitting structure layer after forming the light-emitting structure layer.

12. The method of claim 10 or 11 , wherein the providing of the carbon layer comprises forming a carbon layer including the graphene on a substrate.

13. The method of claim 10 , wherein the forming of the damages comprises using one or more methods among a gas plasma, an ion-beam, an electron beam, a proton beam, and a neutron beam.

14. The method of claim 10 , wherein the formation of the plurality of openings by patterning the mask layer includes using one or more methods among electron beam lithography, photolithography, laser interference lithography, nano-imprinting, and a template.

15. The method of claim 10 or 11 , further comprising:

forming an insulating layer on the carbon layer after growing the microstructures.

16. The method of claim 10 or 11 , further comprising:

forming a second electrode layer on a surface of the carbon layer after forming the light-emitting structure layer.

17. The method of claim 10 or 11 , wherein the light-emitting structure layer comprises an n-type semiconductor layer, a p-type semiconductor layer, and a quantum active layer disposed between the n-type semiconductor layer and the p-type semiconductor layer.

18. The method of claim 10 or 11 , wherein the microstructures comprise a structure selected from the group consisting of a micro-bar, a micro-needle, a micro-tube, and a micro-wall.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S COUNTRY PREVIOUSLY RECORDED ON REEL 030166 FRAME 0725. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNOR'S INTEREST. Recorded Apr 10, 2013
From: YI, GYUCHUL; LEE, CHULHO; KIM, YONGJIN
To: SNU R&DB FOUNDATION
Reel/Frame 030192/0716 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 8, 2013
From: YI, GYUCHUL; LEE, CHULHO; KIM, YONGJIN
To: SNU R&DB FOUNDATION
Reel/Frame 030166/0725 →
Priority Claims (1)
KR 10-2010-0097840 · Oct 7, 2010 · national
Continuity (1)
Related Publication 20130187128A1 · Jul 25, 2013