Elimination of silicon residues from MEMS cavity floor
The present invention generally relates to a MEMS device in which silicon residues from the adhesion promoter material are reduced or even eliminated from the cavity floor. The adhesion promoter is typically used to adhere sacrificial material to material above the substrate. The adhesion promoter is the removed along with then sacrificial material. However, the adhesion promoter leaves silicon based residues within the cavity upon removal. The inventors have discovered that the adhesion promoter can be removed from the cavity area prior to depositing the sacrificial material. The adhesion promoter which remains over the remainder of the substrate is sufficient to adhere the sacrificial material to the substrate without fear of the sacrificial material delaminating. Because no adhesion promoter is used in the cavity area of the device, no silicon residues will be present within the cavity after the switching element of the MEMS device is freed.
1. A method of fabricating a MEMS device, comprising:
depositing an adhesion layer over a substrate having a first portion to be enclosed within a cavity and a second portion to be disposed outside the cavity;
removing the adhesion layer in the area disposed over the first portion;
depositing a sacrificial layer on and in contact with the adhesion layer and the first portion of the substrate;
forming a switching element above the sacrificial layer;
enclosing the switching element within the cavity; and
removing the sacrificial layer.
2. A method of fabricating a MEMS device, comprising:
depositing an adhesion layer over a substrate having a first portion to be enclosed within a cavity and a second portion to be disposed outside the cavity;
removing the adhesion layer in the area disposed over the first portion;
depositing a sacrificial layer over the adhesion layer and the first portion of the substrate;
forming a switching element above the sacrificial layer;
enclosing the switching element within the cavity; and
removing the sacrificial layer, wherein the adhesion layer comprises silicon.
3. A method of fabricating a MEMS device, comprising:
depositing an adhesion layer over a substrate having a first portion to be enclosed within a cavity and a second portion to be disposed outside the cavity;
removing the adhesion layer in the area disposed over the first portion;
depositing a sacrificial layer over the adhesion layer and the first portion of the substrate;
forming a switching element above the sacrificial layer;
enclosing the switching element within the cavity; and
removing the sacrificial layer, wherein the adhesion layer comprises silicon wherein the sacrificial layer comprises a dielectric material.
4. The method of claim 3 , wherein the dielectric material is an organic dielectric material.
5. A method of fabricating a MEMS device, comprising:
depositing an adhesion layer over a substrate having a first portion to be enclosed within a cavity and a second portion to be disposed outside the cavity;
removing the adhesion layer in the area disposed over the first portion;
depositing a sacrificial layer over the adhesion layer and the first portion of the substrate;
forming a switching element above the sacrificial layer;
enclosing the switching element within the cavity; and
removing the sacrificial layer, wherein removing the adhesion layer comprises:
depositing a photoresist layer over the adhesion layer;
exposing select areas the photoresist layer that correspond to the first portion of the substrate;
developing the photoresist layer to remove the select areas of the photoresist layer and thereby form a mask and expose the adhesion layer in the area disposed over the first portion
etching the exposed adhesion layer.
6. The method of claim 5 , further comprising depositing an electrically insulating layer over the substrate prior to depositing the adhesion layer.
7. A method of fabricating a MEMS device, comprising:
depositing an adhesion layer over a substrate having a first portion to be enclosed within a cavity and a second portion to be disposed outside the cavity;
removing the adhesion layer in the area disposed over the first portion;
depositing a sacrificial layer over the adhesion layer and the first portion of the substrate;
forming a switching element above the sacrificial layer;
enclosing the switching element within the cavity; and
removing the sacrificial layer, wherein the adhesion layer comprises silicon covalently bonded to an organic material.
8. A method of fabricating a MEMS device over a substrate having a first portion and a second portion, comprising:
selectively forming an adhesion layer over the first portion of the substrate;
forming a sacrificial layer on and in contact with the adhesion layer and the second portion of the substrate;
forming a switching element over the sacrificial layer and the second portion of the substrate;
enclosing the switching element within a cavity that is at least partially bound by the second portion of the substrate; and
removing the sacrificial layer.
9. A method of fabricating a MEMS device over a substrate having a first portion and a second portion, comprising:
selectively forming an adhesion layer over the first portion of the substrate;
forming a sacrificial layer over the adhesion layer and the second portion of the substrate;
forming a switching element over the sacrificial layer and the second portion of the substrate;
enclosing the switching element within a cavity that is at least partially bound by the second portion of the substrate; and
removing the sacrificial layer, wherein the adhesion layer comprises silicon.
10. A method of fabricating a MEMS device over a substrate having a first portion and a second portion, comprising:
selectively forming an adhesion layer over the first portion of the substrate;
forming a sacrificial layer over the adhesion layer and the second portion of the substrate;
forming a switching element over the sacrificial layer and the second portion of the substrate;
enclosing the switching element within a cavity that is at least partially bound by the second portion of the substrate; and
removing the sacrificial layer, wherein the adhesion layer comprises silicon, wherein the sacrificial layer comprises a dielectric material.
11. The method of claim 10 , wherein the dielectric material is an organic dielectric material.
12. The method of claim 11 , further comprising depositing an electrically insulating layer over the substrate prior to selectively forming the adhesion layer.
13. The method of claim 8 , further comprising depositing an electrically insulating layer over the substrate prior to depositing the adhesion layer.
14. A method of fabricating a MEMS device over a substrate having a first portion and a second portion, comprising:
selectively forming an adhesion layer over the first portion of the substrate;
forming a sacrificial layer over the adhesion layer and the second portion of the substrate;
forming a switching element over the sacrificial layer and the second portion of the substrate;
enclosing the switching element within a cavity that is at least partially bound by the second portion of the substrate; and
removing the sacrificial layer, wherein the adhesion layer comprises silicon covalently bonded to an organic material.