Spectrometer

1. A spectrometer comprising:

a light source section that includes a plurality of light-emitting elements having different emission wavelengths and emits reference light, with which light emitted from the light-emitting elements is mixed, to an object;

a wavelength selection element that selectively extracts light of a predetermined wavelength from light reflected or transmitted from or through the object;

a detection section that detects the amount of light extracted from the wavelength selection element; and

a control section,

wherein the control section includes

a mode switching section that switches a calibration mode for performing a calibration using the object as a reference calibration object, and a measurement mode for measuring spectral characteristics of an object to be measured using the object as the object to be measured,

an outside light analysis section that analyzes characteristics of outside light in the calibration mode,

a reference light setting section that sets the amount of light emitted from each light-emitting element of the light source section, in the calibration mode, on the basis of the characteristics of the outside light analyzed by the outside light analysis section, and

a light source driving section that drives the light-emitting elements, in the measurement mode, on the basis of the amount of light emitted which is set by the reference light setting section.

2. The spectrometer according to claim 1 , wherein the outside light analysis section acquires the amount of light for each wavelength of the outside light, as the characteristics of the outside light, and

the reference light setting section calculates the amount of light emitted from the light-emitting elements corresponding to each wavelength, on the basis of the amount of light for each wavelength of the outside light.

3. The spectrometer according to claim 2 , wherein the control section includes a storage section that stores sensitivity characteristics of the detection section for each wavelength capable of being selected by the wavelength selection element, and spectral characteristics of the wavelength selection element for each wavelength capable of being selected by the wavelength selection element, and

the reference light setting section calculates the amount of light emitted from the light-emitting elements corresponding to each wavelength so that the sum of an outside light characteristic value calculated on the basis of the amount of light for each wavelength of the outside light, the sensitivity characteristics of the detection section and the spectral characteristics of the wavelength selection element, and a reference light characteristic value calculated on the basis of the amount of light emitted from the light-emitting elements for each wavelength, the sensitivity characteristics of the detection section and the spectral characteristics of the wavelength selection element is equal to a set value corresponding to reflectance for each wavelength of the reference calibration object.

4. The spectrometer according to claim 2 , further comprising an outside light detection section that detects the amount of light for each wavelength of the outside light,

wherein the outside light analysis section analyzes the characteristics of the outside light on the basis of a detection result of the outside light detection section.

5. The spectrometer according to claim 3 , further comprising an outside light detection section that detects the amount of light for each wavelength of the outside light,

wherein the outside light analysis section analyzes the characteristics of the outside light on the basis of a detection result of the outside light detection section.

6. The spectrometer according to claim 2 , wherein the wavelength selection element is a variable wavelength interference filter including:

a first substrate;

a second substrate that faces the first substrate;

a first reflective film provided on the first substrate;

a second reflective film, provided on the second substrate, which faces the first reflective film with a gap between the reflective films interposed therebetween; and

a gap change section that changes a size of the gap between the reflective films.

7. The spectrometer according to claim 3 , wherein the wavelength selection element is a variable wavelength interference filter including:

a first substrate;

a second substrate that faces the first substrate;

a first reflective film provided on the first substrate;

a second reflective film, provided on the second substrate, which faces the first reflective film with a gap between the reflective films interposed therebetween; and

a gap change section that changes a size of the gap between the reflective films.

8. The spectrometer according to claim 1 , further comprising a light-emission amount storage section that stores the amount of light emitted from the light-emitting elements corresponding to each wavelength,

wherein the light source driving section drives the light source section, in the calibration mode, on the basis of the amount of light emitted from the light-emitting elements which is stored in the light-emission amount storage section,

the outside light analysis section determines whether the amount of light for each wavelength of the outside light exceeds a predetermined value, as the characteristics of the outside light, and

the reference light setting section reduces the amount of light emitted from the light-emitting elements corresponding to the wavelength, when the amount of light for the wavelength of the outside light exceeds the predetermined value.

9. The spectrometer according to claim 8 , further comprising an outside light detection section that detects the amount of light for each wavelength of the outside light,

wherein the outside light analysis section analyzes the characteristics of the outside light on the basis of a detection result of the outside light detection section.

10. The spectrometer according to claim 8 , wherein the wavelength selection element is a variable wavelength interference filter including:

a first substrate;

a second substrate that faces the first substrate;

a first reflective film provided on the first substrate;

a second reflective film, provided on the second substrate, which faces the first reflective film with a gap between the reflective films interposed therebetween; and

a gap change section that changes a size of the gap between the reflective films.

11. The spectrometer according to claim 1 , further comprising an outside light detection section that detects the amount of light for each wavelength of the outside light,

wherein the outside light analysis section analyzes the characteristics of the outside light on the basis of a detection result of the outside light detection section.

12. The spectrometer according to claim 11 , further comprising:

an outside light characteristic storage section that stores the amount of light for each wavelength of the outside light; and

an outside light monitoring section that calculates a variation in the amount of light for each wavelength, when there is a change in the amount of the outside light in the measurement mode,

wherein the reference light setting section corrects the amount of light emitted from the light-emitting elements, on the basis of the variation in the amount of light which is calculated by the outside light monitoring section.

13. The spectrometer according to claim 11 , wherein the wavelength selection element is a variable wavelength interference filter including:

a first substrate;

a second substrate that faces the first substrate;

a first reflective film provided on the first substrate;

a second reflective film, provided on the second substrate, which faces the first reflective film with a gap between the reflective films interposed therebetween; and

a gap change section that changes a size of the gap between the reflective films.

14. The spectrometer according to claim 1 , wherein the wavelength selection element is a variable wavelength interference filter including:

a first substrate;

a second substrate that faces the first substrate;

a first reflective film provided on the first substrate;

a second reflective film, provided on the second substrate, which faces the first reflective film with a gap between the reflective films interposed therebetween; and

a gap change section that changes a size of the gap between the reflective films.

15. The spectrometer according to claim 14 , wherein the wavelength selection element is a variable wavelength interference filter including:

a first substrate;

a second substrate that faces the first substrate;

a first reflective film provided on the first substrate;

a second reflective film, provided on the second substrate, which faces the first reflective film with a gap between the reflective films interposed therebetween; and

a gap change section that changes a size of the gap between the reflective films.