Multi-level memory cell with continuously tunable switching
View Patent ↗The present disclosure provides a data storage device that includes multi-level memory cells. The data storage device may include circuitry configured to write data to the multi-level memory cell. The write circuitry may include compliance circuitry configured to implement continuously tunable switching. The write circuitry may be configured to select a compliance mode for the switching, the compliance mode being selected from the group comprising current compliance and voltage compliance.
1. A method comprising:
writing data to a multi-level memory cell by setting a resistance level of the multi-level cell, the resistance level corresponding to a bit value; and
selecting a compliance mode used for setting the resistance level of the multi-level cell, the compliance mode comprising current compliance or voltage compliance.
2. The method of claim 1 , wherein setting a resistance level of the multi-level cell comprises OFF-switching the multi-level memory cell from a first resistance corresponding a first bit value to a second resistance corresponding to a second bit value, the second resistance being higher than the first resistance, and wherein the OFF-switching is continuously tunable.
3. The method of claim 1 , wherein setting the multi-level memory cell from the first resistance to the second resistance comprises setting the multi-level memory cell to the second resistance directly without first setting the resistance to the full off state.
4. The method of claim 1 , comprising sensing a current through the multi-level memory cell, determining whether the current exhibits an inflection, and selecting the compliance mode based on whether the current exhibits an inflection.
5. The method of claim 4 , wherein selecting the compliance mode comprises selecting voltage compliance if the current exhibits an inflection.
6. The method of claim 4 , wherein selecting the compliance mode comprises accessing a lookup table that indicates whether a current though the cell is likely to exhibit an inflection based on a bit value stored to the cell prior to initiating the switching.
7. The method of claim 6 , wherein the lookup table is populated based on the results of a RESET test performed for a representative sample of multi-level memory cells, wherein current through the representative sample of multi-level memory cells is measured for each initial resistance state.