IP Library Granted Patent US 8,928,358
Granted Patent B2
US 8,928,358 · App. 13/712,740 · Granted Jan 6, 2015

Sampling

Inventors: Ian Juso Dedic (Northolt Middlesex, GB); Gavin Lambertus Allen (Maidenhead, GB)
Assignee: Fujitsu Semiconductor Limited
H03L7/00G11C27/02H03M1/1215H01H9/54H03M1/1245H03K17/00H03M1/1009H03M1/12H03M1/0614H03M1/0881H03L7/091
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Quick Facts
Patent No.
US 8,928,358
App. No.
13/712,740
Granted
Jan 6, 2015
Kind
B2
Abstract

There is disclosed current-mode time-interleaved sampling circuitry configured to be driven by substantially sinusoidal clock signals. Such circuitry may be incorporated in ADC circuitry, for example as integrated circuitry on an IC chip. The disclosed circuitry is capable of calibrating itself without being taken off-line.

Claims (26)

1. Current-mode circuitry, comprising:

a first node configured to have a flowing current supplied thereto, wherein the flowing current changes in response to an input signal;

a plurality of switches comprising a plurality of first terminals and a plurality of second terminals, wherein each of the plurality of first terminals couples to the first node; and

a plurality of second nodes, wherein each of the plurality of second nodes couples to a corresponding one of the plurality of the second terminals,

wherein the plurality of switches are configured to be sequentially selected during a corresponding plurality of selection periods which occur in succession, successive selection periods of the plurality of selection periods being partially overlapped; and

wherein the circuitry is configured to provide respective sinusoidal control signals to the switches between the first node and the second nodes to control the switches.

2. The current-mode circuitry of claim 1 , wherein the plurality of selection periods which occur in non-succession are non-overlapped.

3. The current-mode circuitry of claim 1 , further comprising:

a current source coupled between the first node and a reference node; and

a third node configured to receive the input signal and be coupled to the first node, the input signal being a current signal.

4. The current-mode circuitry of claim 3 , wherein the current source comprises a constant current flowing from a coupling node between the first node and the third node to the reference node.

5. The current-mode circuitry of claim 1 , further comprising:

a calibration circuit configured to sample currents flowing through each of the plurality of second nodes over time, and calibrate characteristics of the plurality of switches based on sample values.

6. Analogue-to-digital conversion circuitry, comprising circuitry according to claim 1 .

7. Integrated circuitry, comprising circuitry according to claim 1 .

8. An IC chip, comprising circuitry according to claim 1 .

9. A sampling method, comprising:

sequentially distributing a current to a plurality of current paths during a corresponding plurality of distribution periods which occur in succession; and

providing respective sinusoidal control signals to switches in the current paths to control a distribution of the current to the plurality of current paths;

wherein successive distribution periods of the plurality of distribution periods are partially overlapped.

10. The sampling method of claim 9 , wherein the plurality of distribution periods which occur in non-succession are non-overlapped.

11. The sampling method of claim 9 , further comprising:

generating the current based on a difference between an input current and a reference current.

12. The sampling method of claim 11 , wherein the reference current is a constant current.

13. The current-mode circuitry of claim 1 , further comprising:

a reset circuit coupled to one of the second nodes, and configured, during a period between successive selection periods for the one or the second nodes, to bring a voltage potential of the one of the second nodes to a particular value.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0637 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 17, 2013
From: DEDIC, IAN J.; ALLEN, GAVIN L.
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 029652/0176 →
CHANGE OF NAME Recorded Jan 17, 2013
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 029660/0228 →
Priority Claims (1)
EP 09250202 · Jan 26, 2009 · regional
Continuity (2)
Division 12686757 · Jan 13, 2010
Related Publication 20130099948A1 · Apr 25, 2013