3D shape measurement using dithering
View Patent ↗A method for three-dimensional (3D) shape measurement includes generating fringe patterns using a dithering technique, projecting the fringe patterns onto an object using a projector, capturing the fringe patterns distorted by surface geometry of the object using an imaging device, and performing a fringe analysis to reconstruct a 3D shape of the object using the fringe patterns and the fringe patterns distorted by the surface geometry of the object. The step of generating the fringe patterns using the dithering technique may include binarizing sinuisoidal fringe patterns with the dithering technique. The step of generating the fringe patterns using the dithering technique may include applying an optimization algorithm.
1. A method for three-dimensional (3D) shape measurement comprising:
generating fringe patterns using a dithering technique;
projecting the fringe patterns onto an object using a projector;
capturing the fringe patterns distorted by surface geometry of the object using an imaging device; and
performing a fringe analysis to reconstruct a 3D shape of the object using the fringe patterns and the fringe patterns distorted by the surface geometry of the object.
2. The method of claim 1 wherein the step of generating the fringe patterns using the dithering technique comprises binarizing sinuisoidal fringe patterns with the dithering technique.
3. The method of claim 1 wherein the step of generating the fringe patterns using the dithering technique comprises applying an optimization algorithm.
4. The method of claim 1 wherein the fringe patterns approximate sinusoidal structures.
5. The method of claim 1 further comprising adjusting focus of the projector before projecting the fringe patterns.
6. The method of claim 1 further comprising generating an additional set of fringe patterns using a pulse width modulation technique.
7. The method of claim 6 further comprising projecting the additional set of the fringe patterns onto the object using the projector.
8. The method of claim 7 further comprising capturing the additional set of the fringe patterns distorted by the surface geometry of the object using the imaging device.
9. The method of claim 8 wherein the fringe analysis to reconstruct the 3D shape of the object further uses the additional set of the fringe patterns and the additional set of the fringe patterns as distorted by the surface geometry of the object.
10. The method of claim 9 wherein the pulse width modulation technique is an optimal pulse width modulation (OPWM) technique.
11. The method of claim 10 wherein the fringe patterns consist of low-frequency fringe patterns and the additional set of the fringe patterns consists of high-frequency fringe patterns.
12. The method of claim 1 wherein the imaging device is a camera.
13. A method for three-dimensional (3D) shape measurement comprising:
generating a first set of fringe patterns using a dithering technique;
generating a second set of fringe patterns using a pulse width modulation technique;
projecting the fringe patterns from the first set of the fringe patterns and the second set of the fringe patterns onto an object using a projector;
capturing the fringe patterns distorted by surface geometry of the object using an imaging device; and
performing a fringe analysis to reconstruct a 3D shape of the object using the fringe patterns and the fringe patterns distorted by the surface geometry of the object using a computing device.
14. The method of claim 13 wherein the fringe patterns in the second set of the fringe patterns have higher frequencies than the fringe patterns in the first set of the fringe patterns.
15. The method of claim 14 wherein the first set of the fringe patterns consists of three fringe patterns and wherein the second set of the fringe patterns consists of three fringe patterns.
16. The method of claim 15 wherein the fringe analysis provides for determining an absolute phase change.