IP Library Granted Patent US 8,932,389
Granted Patent B2
US 8,932,389 · App. 13/681,191 · Granted Jan 13, 2015

Zinc oxide precursor and method of depositing zinc oxide-based thin film using the same

Inventors: Sooho Park (ChungCheongNam-Do, KR); Seohyun Kim (ChungCheongNam-Do, KR); Jeongwoo Park (ChungCheongNam-Do, KR); Taejung Park (ChungCheongNam-Do, KR); YoungZo Yoo (ChungCheongNam-Do, KR); GunSang Yoon (ChungCheongNam-Do, KR); Eun-Ho Choi (ChungCheongNam-Do, KR); Myong Woon Kim (ChungCheongNam-Do, KR); Bogyeong Kim (ChungCheongNam-Do, KR); Hyung Soo Shin (ChungCheongNam-Do, KR); Seung Ho Yoo (ChungCheongNam-Do, KR); Sang Do Lee (ChungCheongNam-Do, KR); Sang Ick Lee (ChungCheongNam-Do, KR); Sang Jun Yim (ChungCheongNam-Do, KR)
Assignee: Samsung Corning Precision Materials Co., Ltd.
C07F3/06C07F17/00C23C16/407
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Quick Facts
Patent No.
US 8,932,389
App. No.
13/681,191
Granted
Jan 13, 2015
Kind
B2
Abstract

A zinc oxide precursor for use in deposition of a zinc oxide-based thin film contains a zincocene having the following formula or a derivative thereof: where R1 and R2 are hydrogen or C n H 2n+1 . The n is a number selected from 1 to 3, and the R1 and R2 is one selected from the group consisting of hydrogen, a methyl group, an ethyl group and an i-propyl group. A method of depositing a zinc oxide-based thin film includes the following steps of: loading a substrate into a deposition chamber; and supplying the above-described zinc oxide precursor and an oxidizer into the deposition chamber and forming a zinc oxide-based thin film on the substrate via chemical vapor deposition. In an exemplary embodiment, the zinc oxide-based thin film may be formed on the substrate via atmospheric pressure chemical vapor deposition.

Claims (9)

1. A zinc oxide precursor composition for use in deposition of a zinc oxide-based thin film, comprising:

a zincocene having the following formula or a derivative thereof:

where R1 and R2 are hydrogen or C n H 2n+1 ;

a carrier gas; and

an oxidizing gas.

2. The zinc oxide precursor composition of claim 1 , wherein the n is a number selected from 1 to 3.

3. The zinc oxide precursor composition of claim 2 , wherein the R1 and R2 comprise one selected from the group consisting of hydrogen, a methyl group, an ethyl group and an i-propyl group.

4. The zinc oxide precursor composition of claim 1 , wherein the zinc oxide precursor composition comprises a symmetric compound with the R1 and R2 being identical to each other, or comprises an asymmetric compound with the R1 and R2 being different from each other.

5. The zinc oxide precursor composition of claim 1 , comprising a zinc oxide precursor composition for use in atmospheric pressure chemical vapor deposition.

Assignments (2)
CHANGE OF NAME Recorded Jan 27, 2015
From: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
To: CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 034825/0890 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 24, 2014
From: PARK, SOOHO; KIM, SEOHYUN; PARK, JEONGWOO; PARK, TAEJUNG; YOO, YOUNGZO; YOON, GUNSANG; CHOI, EUN-HO; KIM, MYONG WOON; KIM, BOGYEONG; SHIN, HYUNG SOO; YOO, SEUNG HO; LEE, SANG DO; LEE, SANG ICK; YIM, SANG JUN
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 033809/0717 →
Priority Claims (1)
KR 10-2011-0120425 · Nov 17, 2011 · national
Continuity (1)
Related Publication 20130171341A1 · Jul 4, 2013