IP Library Granted Patent US 8,945,951
Granted Patent B2
US 8,945,951 · App. 13/062,245 · Granted Feb 3, 2015

Lead frame and manufacturing method thereof

Inventors: Chang Hwa Park (Seoul, KR); Eun Jin Kim (Seoul, KR); Jin Young Son (Seoul, KR); Kyoung Taek Park (Seoul, KR); In Kuk Cho (Seoul, KR)
Assignee: LG Innotek Co., Ltd.
H01L23/49582H01L23/49548H01L2224/85439
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Quick Facts
Patent No.
US 8,945,951
App. No.
13/062,245
Granted
Feb 3, 2015
Kind
B2
Abstract

Disclosed are a lead frame and a method for manufacturing the same. The lead frame includes a copper substrate and a rough copper layer having surface roughness of 110 nm to 300 nm on a surface of the copper substrate.

Claims (26)

1. A lead frame comprising:

a copper substrate, wherein the copper substrate includes nickel (Ni), magnesium (Mg), and silicon (Si);

a rough copper layer having surface roughness of 110 nm to 300 nm and formed over a surface of the copper substrate; and

a metal layer with a rough upper surface formed over the rough copper layer, wherein the rough upper surface of the metal layer has a rough surface profile different from that of the rouge copper layer.

2. The lead frame of claim 1 , further comprising a silver plating layer locally formed over the rough copper layer.

3. The lead frame of claim 1 , wherein the rough copper layer has a thickness of 0.3 μm to 0.6 μm.

4. The lead frame of claim 1 , wherein the metal layer with a rough upper surface is formed of nickel (Ni), palladium (Pd), or gold (Au).

5. A lead frame comprising:

a copper substrate, wherein the copper substrate includes nickel (Ni), magnesium (Mg), and silicon (Si);

a rough copper layer over the copper substrate;

a Ni layer over the rough copper layer;

a Pd layer over the Ni layer; and

an Au layer over the Pd layer;

wherein the Ni layer, Pd layer, and Au layer each has a rough upper surface with a rough surface profile different from that of the rough copper layer.

6. The lead frame of claim 5 , wherein the Au layer has surface roughness of 90 nm to 270 nm.

7. The lead frame of claim 5 , wherein the Ni layer is thicker than the Pd layer, and the Pd layer is thicker than the Au layer.

8. A method for manufacturing a lead frame, the method comprising:

preparing a copper substrate, wherein the copper substrate includes nickel (Ni), magnesium (Mg), and silicon (Si);

forming a rough copper layer by electrically plating the copper substrate in a copper sulfate pentahydrate solution; and

forming a metal layer with a rough upper surface over the rough copper layer, wherein the rough upper surface of the metal layer has a rough surface profile different from that of the rough copper layer.

9. The method of claim 8 , wherein the rough copper layer is formed by using the copper sulfate pentahydrate solution containing copper ions having density of 5 g/L to 70 g/L at current density of 3ASD to 7ASD for time of 10 seconds to 40 seconds.

10. The method of claim 8 , wherein the rough copper layer has surface roughness of 110 nm to 300 nm.

11. The method of claim 8 , wherein the rough copper layer has a thickness of 0.3 μm to 0.6 μm.

12. The method of claim 8 , further comprising locally forming a silver plating layer on the rough copper layer.

13. The method of claim 8 , wherein the metal layer with a rough upper surface is formed of Ni, Pd, or Au.

14. The method of claim 13 , wherein the Au layer has surface roughness of 90 nm to 270 nm.

Assignments (3)
CHANGE OF NAME Recorded May 14, 2025
From: ALS CO., LTD.
To: INNOTRO CO., LTD.
Reel/Frame 071275/0763 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2015
From: LG INNOTEK CO., LTD.
To: ALS CO., LTD.
Reel/Frame 035598/0488 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2011
From: PARK, CHANG HWA; KIM, EUN JIN; SON, JIN YOUNG; PARK, KYOUNG TAEK; CHO, IN KUK
To: LG INNOTEK CO., LTD.
Reel/Frame 025974/0740 →
Priority Claims (1)
KR 10-2008-0087689 · Sep 5, 2008 · national
Continuity (1)
Related Publication 20110272184A1 · Nov 10, 2011