Multilevel magnetic element

1. A method for operating a magnetic element, the magnetic element comprising: a soft ferromagnetic layer having a magnetization that can be freely aligned; a first hard ferromagnetic layer having a magnetization that is fixed at a first low temperature threshold and freely alignable at a first high temperature threshold; a first tunnel barrier layer between the soft ferromagnetic layer and the first hard ferromagnetic layer; a second hard ferromagnetic layer having a magnetization that is fixed at the first low temperature threshold and freely alignable at a second high temperature threshold; and a second tunnel barrier layer; the soft ferromagnetic layer being comprised between the first and second tunnel barrier layers; the method comprising, during a write operation:

heating said magnetic element to the first high temperature threshold;

applying a first write magnetic field such as to align the magnetization of the first storage layer and the magnetization of the second storage layer in accordance with the first magnetic field;

cooling said magnetic element to the first low temperature threshold such as to freeze the magnetization of the first and second storage layers in their aligned state.

2. Method according to claim 1 , wherein

the first predetermined high temperature threshold is higher than the second predetermined high temperature threshold; the method further comprising:

cooling said magnetic element to the second high temperature threshold; and

applying a second write magnetic field such as to align the magnetization of the second storage layer in accordance with the second magnetic field; such that up to four distinct state levels can be written in the magnetic element.

3. Method according to claim 2 , wherein

the first write magnetic field is oriented in a direction opposed to the one of the second write magnetic field, such that the magnetization of the first storage layer is aligned in a direction opposed of the magnetization of the second storage layer.

4. Method according to claim 2 , wherein

the first write magnetic field is oriented in the same direction as the one of the second write magnetic field, such that the magnetization of the first storage layer is aligned in the same direction as the one of the magnetization of the second storage layer.

5. Method according to claim 1 , further comprising, during a read operation

applying a first read magnetic field such as to align the magnetization of the sense layer in a first aligned direction in accordance with the first read magnetic field;

measuring a first resistance of the magnetic element;

applying a second read magnetic field such as to align the magnetization of the sense layer in a second aligned direction in accordance with the second read magnetic field; and

measuring a second resistance of the magnetic element.

6. Method according to claim 5 , wherein

the first hard ferromagnetic layer and the second hard ferromagnetic layer have different magnetic moments; and wherein

the first read magnetic field is applied with a zero field value.

7. A method for operating a multilevel magnetic element, the magnetic element comprising a soft ferromagnetic layer having a magnetization that can be freely aligned; a first hard ferromagnetic layer having a magnetization that is fixed at a first low temperature threshold and freely alignable at a first high temperature threshold; a first tunnel barrier layer between the soft ferromagnetic layer and the first hard ferromagnetic layer; a second hard ferromagnetic layer having a magnetization that is fixed at the first low temperature threshold and freely alignable at a second high temperature threshold, lower than the first predetermined high temperature threshold; and a second tunnel barrier layer; the soft ferromagnetic layer being comprised between the first and second tunnel barrier layers;

the method comprising, during a write operation:

heating said magnetic element to the first high temperature threshold such as to free the magnetization of the first and second storage layers;

applying a first write magnetic field such as to align the magnetization of the first storage layer in accordance with the first magnetic field;

cooling said magnetic element to the second high temperature threshold such as to freeze the magnetization of the first storage layer and free the magnetization of the second storage layer; and

applying a second write magnetic field such as to align the magnetization of the second storage layer in accordance with the second magnetic field.

8. Method according to claim 7 ,

further comprising cooling said magnetic element to the first low temperature threshold such as to freeze the magnetization of the second storage layer in its aligned state.

9. Method according to claim 7 ,

wherein said cooling said magnetic element to the second high temperature threshold is performed while maintaining the first magnetic field until the first antiferromagnetic layer reaches the second predetermined high temperature threshold.

10. Method according to claim 8 ,

wherein said cooling said magnetic element to the first low temperature threshold is performed while maintaining the second magnetic field until the second antiferromagnetic layer reaches the first predetermined low temperature threshold.

11. Method according to claim 7 ,

wherein the first antiferromagnetic layer is made of IrMn and the second antiferromagnetic layer is made of FeMn.

12. Method according to claim 11 ,

wherein each of the first and second storage layer is made of NiFe/CoFeB and the sense layer is made of CoFeB.

13. Method according to claim 11 ,

wherein each of the first and second tunnel barrier layer is made of MgO.

14. Method according to claim 7 ,

wherein the first write magnetic field is oriented in a direction opposed to the one of the second write magnetic field, such that the magnetization of the first storage layer is aligned in a direction opposed of the one of second storage layer magnetization.

15. Method according to claim 7 ,

wherein the first write magnetic field is oriented in the same direction as the one of the second write magnetic field, such that the magnetization of the first storage layer is aligned in the same direction as the one of the second storage layer magnetization.