IP Library Granted Patent US 9,030,664
Granted Patent B2
US 9,030,664 · App. 13/334,845 · Granted May 12, 2015

Apparatus for measuring transmissivity of patterned glass substrate

Inventors: Kyungwook Park (ChungCheongNam-Do, KR); YoonYoung Kwon (ChungCheongNam-Do, KR); Jaeyoung Choi (ChungCheongNam-Do, KR); Jongsung Lee (ChungCheongNam-Do, KR); Hoikwan Lee (ChungCheongNam-Do, KR); Seo-Yeong Cho (ChungCheongNam-Do, KR); Kyungmin Yoon (ChungCheongNam-Do, KR)
Assignee: Samsung Corning Precision Materials Co., Ltd.
G01N21/958G01N21/59
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Quick Facts
Patent No.
US 9,030,664
App. No.
13/334,845
Granted
May 12, 2015
Kind
B2
Abstract

An apparatus for measuring transmissivity of a patterned glass substrate. A beam radiator radiates a laser beam. A collimation lens collimates the laser beam radiated from the laser beam radiator. A beam expander expands a size of the laser beam collimated by the collimation lens. A detector has a light-receiving section, which receives the laser beam that has passed through the patterned glass substrate after having been expanded by the beam expander. A measuring instrument measures a transmissivity of the patterned glass substrate using the laser beam received by the detector.

Claims (11)

1. A method for measuring transmissivity of a patterned glass substrate, comprising:

radiating a laser beam having a size, at a single wavelength of 550 nm;

collimating the laser beam with a collimation lens;

expanding the size of the collimated laser beam;

passing the expanded laser beam through a glass substrate having a plurality of pattern units on which the expanded collimated laser beam is incident;

receiving, at a detector having a light-receiving section at least twice as large as a size of the expanded laser beam that is incident on the patterned glass substrate, the expanded laser beam that is passed through the patterned glass substrate; and

measuring transmissivity of the patterned glass substrate based on the received laser beam;

wherein the detector is 5 mm or less from a rear end of the patterned glass substrate.

2. The method of claim 1 , wherein the collimated laser beam is expaned to such a size that the expanded laser beam can be incident on at least 10 pattern units of the patterned glass substrate.

3. The method of claim 1 , further comprising reflecting the laser beam off of a mirror into the collimation lens.

4. The method of claim 3 , further comprising using a noise filter to remove noise from the reflected laser beam.

Assignments (2)
CHANGE OF NAME Recorded May 16, 2017
From: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
To: CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 042469/0953 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2012
From: PARK, KYUNGWOOK; KWON, YOONYOUNG; CHOI, JAEYOUNG; LEE, JONGSUNG; LEE, HOIKWAN; CHO, SEO-YEONG; YOON, KYUNGMIN
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 027532/0572 →
Priority Claims (1)
KR 10-2010-0139257 · Dec 30, 2010 · national
Continuity (1)
Related Publication 20120170040A1 · Jul 5, 2012