Immunity of phase change material to disturb in the amorphous phase
Disturb from the reset to the set state may be reduced by creating an amorphous phase that is substantially free of crystal nuclei when programming the reset state in a phase change memory. In some embodiments, this can be achieved by using a current or a voltage to program that exceeds the threshold voltage of the phase change memory element, but does not exceed a safe current voltage which would cause a disturb.
1. A method comprising:
reading a cell of a memory including a phase change memory element and an ovonic threshold switch using a refresh pulse followed by a read pulse to determine a threshold voltage of the cell to be read.
2. The method of claim 1 including determining whether the cell is on.
3. The method of claim 2 wherein if the cell is not on, using a refresh pulse greater than the cell's maximum expected threshold voltage.
4. The method of claim 3 including increasing a resulting current.
5. The method of claim 4 including, depending on a resistance that is determined, recording a detected state or forcing another refresh pulse and another read pulse.
6. A phase change memory comprising:
a phase change memory array including phase change memory elements and ovonic threshold switches; and
circuitry to read said array using a refresh pulse followed by a read pulse to determine the threshold voltage of a cell to be read.
7. The memory of claim 6 said circuitry to determine whether the cell is on.
8. The memory of claim 7 wherein, if the cell is not on, said circuitry to generate a refresh pulse greater than the cell's maximum expected threshold voltage.
9. The memory of claim 8 , said circuitry to increase a resulting current.
10. The memory of claim 9 , said circuitry to record a detected state or force another refresh pulse and another read pulse, depending on a determined resistance.