IP Library › Granted Patent US 9,058,985
Granted Patent B2
US 9,058,985 · App. 14/070,999 · Granted Jun 16, 2015

Method of manufacturing graphene laminated structure, graphene laminated structure, and electronic device including the graphene laminated structure

Inventors: Sang-woo Kim (Seoul, KR); Sang-a Han (Seoul, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L21/0237H01L29/1606B82Y40/00H01L29/267H01L29/778H01L21/02491H01L21/02527H01L21/0262C30B29/02
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Quick Facts
Patent No.
US 9,058,985
App. No.
14/070,999
Granted
Jun 16, 2015
Kind
B2
Abstract

A method of manufacturing a graphene laminated structure includes plasma-treating a surface of a hexagonal boron nitride sheet using a fluorine-based gas plasma, depositing the hexagonal boron nitride sheet on a graphene sheet, and forming an insulating layer on a surface of the surface-treated hexagonal boron nitride sheet.

Claims (24)

1. A method of manufacturing a graphene laminated structure, the method comprising:

plasma-treating a surface of a hexagonal boron nitride sheet using a fluorine-based gas plasma;

depositing the hexagonal boron nitride sheet on a graphene sheet; and

forming an insulating layer on a surface of the surface-treated hexagonal boron nitride sheet.

2. The method of claim 1 , wherein the plasma-treating includes using at least one gas selected from CF 4 , CHF 3 , SF 6 , and NF 3 .

3. The method of claim 1 , wherein the plasma-treating is performed at a flow rate of about 1 to about 10 sccm and at a plasma surface treatment pressure of about 300 to about 700 mTorr for about 1 to about 10 seconds.

4. The method of claim 1 , wherein

the hexagonal boron nitride sheet has a two-dimensional planar structure including a B—N bond that is a sp 2 covalent bond and an interlayer bond that is a Van Der Waals bond, and

the hexagonal boron nitride sheet has a thickness of 10 nm or less.

5. The method of claim 1 , wherein the plasma-treating includes plasma-treating the surface of the hexagonal boron nitride sheet having an area of about 1 cm 2 or more.

6. The method of claim 1 , further comprising:

providing the hexagonal boron nitride sheet on a metal catalyst thin film before the plasma-treating.

7. The method of claim 6 , further comprising:

removing the metal catalyst thin film from the hexagonal boron nitride sheet by etching after the plasma-treating.

8. The method of claim 1 , wherein

the graphene sheet is one of a single layer of a polycyclic aromatic sheet including a plurality of carbon atoms connected to each other via a covalent bond and arranged on a plane, and a multi-layer formed by stacking a plurality of the polycyclic aromatic sheets, and

the graphene sheet has a thickness of about 30 nm or less.

9. The method of claim 1 , wherein the depositing deposits the hexagonal boron nitride sheet on the graphene sheet having an area of about 1 cm 2 or more.

10. The method of claim 1 , further comprising:

providing the graphene sheet on at least one substrate before the depositing, the substrate including at least one of a Si substrate, a SiC substrate, a glass substrate, a GaN substrate, a silica substrate, a sapphire substrate, a metal substrate, and a carbon substrate.

11. The method of claim 1 , wherein the forming an insulating layer forms a high-k dielectric material having a dielectric constant of 7 or more.

12. The method of claim 1 , wherein the forming an insulating layer includes forming at least one of a metal oxide, a metal nitride, a polymer, and an organic molecule.

13. The method of claim 12 , wherein the forming an insulating layer includes forming the metal oxide, the metal oxide including at least one of a silicon oxide, an aluminum oxide, a tantalum oxide, a titanium oxide, a tin oxide, a vanadium oxide, a bariumstrontium titanate, a barium zirconate titanate, a lead zirconate titanate, a lead lantanium titanate, a strontium titanate, a barium titanate, a barium magnesium fluoride, a lantanium oxide, a fluorine oxide, a magnesium oxide, a bismuth oxide, a bismuth titanate, a niobium oxide, a strontium bismuth titanate, a strontium bismuth tantalate, a tantalum pentoxide, a bismuth tantalite niobumate, and a yttrium oxide.

14. The method of claim 1 , wherein the forming an insulating layer includes at least one of atomic layer deposition, vacuum deposition, molecular-ray epitaxial growth, ion cluster beaming, low-energy ion-beaming, ion plating, chemical vapor deposition (CVD), sputtering, atmospheric plasma method, spray-coating, spin coating, blade coating, dip coating, casting, roll coating, bar coating, and die coating.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2013
From: KIM, SANG-WOO; HAN, SANG-A
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 031540/0214 →
Priority Claims (1)
KR 10-2013-0019373 · Feb 22, 2013 · national
Continuity (1)
Related Publication 20140239256A1 · Aug 28, 2014