Specimen mount for microscopy
Mounts, stages, and systems that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope. The mounts fixture and interface with a device, wherein the device corresponds to a structure that holds a specimen for microscopic imaging. The mounts are mateably and/or electrically compatible with a stage. Systems using the devices, mounts, and stages that can be used directly within the electron microscope are disclosed.
1. A system for in situ manipulation, experimentation and analysis of at least one microscopy specimen directly within a microscope, said system comprising a mount that interfaces with a stage,
wherein the mount comprises two or more contacts that fixture a device to the mount, wherein the device is useful for supporting a specimen,
wherein signal leads are embedded in, and electrically insulated from, the mount for making electrical connections from the mount to the device,
wherein the stage comprises a receptacle that is electrically connectable to the mount, and
wherein the receptacle is electrically connectable to an external wall of the microscope.
2. The system of claim 1 , wherein the device comprises:
(a) a membrane comprising at least one membrane region; and
(b) at least one conductive element in contact with the membrane.
3. The system of claim 1 , wherein the mount comprises a top and a bottom and at least one of a mateable mount connector and an electrical mount connector.
4. The system of claim 3 , wherein the mateable mount connector is positioned on the bottom of the mount and makes physical and electrical contact with the stage.
5. The system of claim 1 , further comprising a mount void, wherein the mount void permits electrons or other signals to pass through the mount and the device to a detector.
6. The system of claim 1 , wherein the stage comprises a top and a bottom and a mateable stage connector.
7. The system of claim 6 , wherein the mateable stage connector is positioned on the top of the stage for mechanical interfacing with the mount.
8. The system of claim 6 , wherein the stage further comprises a stage void that permits electrons or other signals to pass through the stage.
9. The system of claim 6 , wherein the mateable stage connector includes at least one electrical stage connector thereon.
10. The system of claim 6 , wherein the mateable stage connector is positioned on the top of the stage and makes physical and electrical contact with the mount.
11. The system of claim 1 , wherein the stage is fixable to a microscope stage.
12. The system of claim 1 , wherein the system provides electrical and/or thermal stimuli to the specimen for in situ experiments.
13. The system of claim 1 for single in situ experiments, for multiple, sequential in situ experiments, or for multiple, simultaneous in situ experiments.
14. The system of claim 1 , wherein a conduit connects the receptacle to an exterior wall of the microscope to enable electrical connections, wherein the conduit comprises an electrical wire extending therethrough.
15. A method of manipulating, experimenting and analyzing a microscopy specimen in situ, said method comprising:
placing a microscopy specimen on a device;
fixturing the device in a system of claim 1 ;
applying electricity to manipulate the specimen electrically, chemically and/or thermally; and
detecting and analyzing the in situ changes.
16. The system of claim 1 , wherein the two or more contacts provide an electrical connection from the signal leads on the mount to an electrode on the device.
17. The system of claim 1 , wherein the two or more contacts are spring loaded so that spring tension fixtures the device to the mount.